基于故障对布尔表的模拟电路测试性分析方法
发布时间：2018-09-16 21:42
【摘要】：为充分利用测试性验证试验的故障响应特征信息,提高测试性分析结果的准确性,基于故障物理注入技术,提出采用整数对布尔表对模拟电路进行测试性分析的方法。首先分析现有测试性分析方法存在的不足之处;然后根据实测数据构建故障对布尔表,并以此为基础提出预计故障检测率、故障隔离率和故障虚警率等指标的计算公式以及测试性分析步骤;最后结合串联稳压电路实例对文章所提方法进行验证。实验结果表明:与D矩阵模型方法和整数编码字典方法相比,该法都具有更高的故障分辨能力,能够为模拟电路的测试性分析提供更准确的评价指标。
[Abstract]:In order to make full use of the fault response characteristic information of testability verification test and improve the accuracy of testability analysis results, a testability analysis method based on integer Boolean table for analog circuits is proposed based on fault physical injection technique. Firstly, the shortcomings of the existing testability analysis methods are analyzed, and then the fault pair Boolean table is constructed according to the measured data, and based on this, the estimated fault detection rate is proposed. The calculation formula of fault isolation rate and fault false alarm rate and the steps of testability analysis are given. Finally, the method proposed in this paper is verified by an example of series voltage stabilizing circuit. The experimental results show that compared with the D matrix model method and the integer coding dictionary method, this method has higher fault resolution ability and can provide more accurate evaluation indexes for the testability analysis of analog circuits.
【作者单位】： 海军航空工程学院研究生管理大队;海军航空工程学院科研部;92514部队;
【基金】：国家自然科学基金项目(61473306)
【分类号】：TN710
[Abstract]:In order to make full use of the fault response characteristic information of testability verification test and improve the accuracy of testability analysis results, a testability analysis method based on integer Boolean table for analog circuits is proposed based on fault physical injection technique. Firstly, the shortcomings of the existing testability analysis methods are analyzed, and then the fault pair Boolean table is constructed according to the measured data, and based on this, the estimated fault detection rate is proposed. The calculation formula of fault isolation rate and fault false alarm rate and the steps of testability analysis are given. Finally, the method proposed in this paper is verified by an example of series voltage stabilizing circuit. The experimental results show that compared with the D matrix model method and the integer coding dictionary method, this method has higher fault resolution ability and can provide more accurate evaluation indexes for the testability analysis of analog circuits.
【作者单位】： 海军航空工程学院研究生管理大队;海军航空工程学院科研部;92514部队;
【基金】：国家自然科学基金项目(61473306)
【分类号】：TN710
【相似文献】
相关期刊论文 前10条
1 张艺琼;武月琴;曾照洋;余鹏;;测试性验证试验中的综合评估方法[J];测控技术;2013年06期
2 付剑平;陆民燕;;基于模糊综合评价的软件测试性度量[J];计算机工程与应用;2009年27期
3 张向荣;电子系统维修性、测试性分析与设计方法讨论[J];航天控制;2004年05期
4 田仲;测试性验证方法研究[J];航空学报;1995年S1期
5 张艺琼;刘萌萌;李t，
本文编号：2244897
本文链接：https://www.wllwen.com/kejilunwen/dianzigongchenglunwen/2244897.html
