基于频谱响应特性的集成电路故障预测技术
发布时间：2018-11-09 17:02
【摘要】：提出了一种基于频谱响应特性的集成电路故障预测技术,该技术成功实现了数字芯片SP3232E在故障诊断与故障预测中的应用,并验证了其在电子元器件的故障诊断与故障预测上的可行性与有效性。实验结果表明,该方法的故障诊断准确率高达92%以上;该数字器件延时信号经过频谱分析后的相位与其对应的退化率呈单指数函数关系,且随着扫频频率的减小,器件的相位增加,退化率减小,退化率50%~80%对应的相位区间可定义为器件的故障诊断阈值或预警区间;在低频下相位的变化速度更慢,故该方法在低频下的故障预测误差更小,故障预测精度更高。
[Abstract]:An integrated circuit fault prediction technology based on spectrum response characteristics is proposed. The application of digital chip SP3232E in fault diagnosis and fault prediction is successfully realized. Its feasibility and effectiveness in fault diagnosis and fault prediction of electronic components are verified. The experimental results show that the accuracy of fault diagnosis is over 92%. The phase of the delay signal of the digital device after spectrum analysis has a single exponential function relationship with its corresponding degradation rate. With the decrease of the sweep frequency, the phase of the device increases and the degradation rate decreases. The phase range corresponding to 80% of the degradation rate can be defined as the fault diagnosis threshold or early warning interval of the device. The speed of phase change is slower at low frequency, so the error of fault prediction is smaller and the precision of fault prediction is higher.
【作者单位】： 华南理工大学材料科学与工程学院;工业和信息化部电子第五研究所电子元器件可靠性物理及其应用技术重点实验室;
【基金】：民机预研专项资助项目(MIZ1528010) 国家技术基础科研项目(JSZL2014610B002)
【分类号】：TN407
，
本文编号：2321036
[Abstract]:An integrated circuit fault prediction technology based on spectrum response characteristics is proposed. The application of digital chip SP3232E in fault diagnosis and fault prediction is successfully realized. Its feasibility and effectiveness in fault diagnosis and fault prediction of electronic components are verified. The experimental results show that the accuracy of fault diagnosis is over 92%. The phase of the delay signal of the digital device after spectrum analysis has a single exponential function relationship with its corresponding degradation rate. With the decrease of the sweep frequency, the phase of the device increases and the degradation rate decreases. The phase range corresponding to 80% of the degradation rate can be defined as the fault diagnosis threshold or early warning interval of the device. The speed of phase change is slower at low frequency, so the error of fault prediction is smaller and the precision of fault prediction is higher.
【作者单位】： 华南理工大学材料科学与工程学院;工业和信息化部电子第五研究所电子元器件可靠性物理及其应用技术重点实验室;
【基金】：民机预研专项资助项目(MIZ1528010) 国家技术基础科研项目(JSZL2014610B002)
【分类号】：TN407
，
本文编号：2321036
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