考虑老化进程对热参数影响的IGBT模块寿命评估

发布时间：2018-12-11 21:43

【摘要】：绝缘栅双极型晶体管(insulated gate bipolar transistor,IGBT)模块是风电转换系统中最为薄弱的环节之一,其准确的寿命和可靠性评估对风电系统安全运行尤其重要。然而,目前IGBT模块寿命评估模型主要采用基于数据手册的瞬态热阻曲线或者试验测试初始结果的热模型,并未考虑IGBT模块老化过程对热参数的影响。该文提出考虑老化进程对热参数影响的IGBT模块寿命评估模型,该模型能够计及老化过程中因热参数增大而带来的热载荷上升和寿命减小,提高了寿命评估的准确性。首先,理论和试验分析了老化进程对热参数的影响规律,提出了考虑老化进程影响的IGBT模块寿命评估模型;其次,对比分析了该模型与现有常用寿命模型之间的差异;最后以实际风电场为例,进一步分析了不同时间尺度下考虑老化影响的模块寿命消耗。
[Abstract]:The insulated gate bipolar transistor (insulated gate bipolar transistor,IGBT) module is one of the weakest links in the wind power conversion system, and its accurate life and reliability evaluation is particularly important for the safe operation of the wind power system. However, the current IGBT module life evaluation model mainly uses the transient thermal resistance curve based on the data manual or the thermal model of the initial test results, and does not consider the influence of the aging process of the IGBT module on the thermal parameters. In this paper, a life evaluation model of IGBT module considering the influence of aging process on thermal parameters is proposed. The model can take into account the increase of thermal load and the decrease of life due to the increase of thermal parameters during aging, and improve the accuracy of life evaluation. Firstly, the influence of aging process on thermal parameters is analyzed theoretically and experimentally, and the life evaluation model of IGBT module considering the influence of aging process is put forward, secondly, the difference between this model and existing life models is compared and analyzed. Finally, taking the actual wind farm as an example, the module life consumption considering the influence of aging in different time scales is further analyzed.
【作者单位】：输配电装备及系统安全与新技术国家重点实验室(重庆大学);
【基金】：国家自然科学基金资助项目(51477019) 国家重点基础研究发展计划项目(973项目)(2012CB25200) 中央高校基本科研业务费项目(106112015CDJXY150004)~~
【分类号】：TN322.8

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