利用红外热像仪进行物体表面波段法向发射率测量

发布时间：2019-01-18 09:48

【摘要】：辐射测温法以其响应速度快、测温范围广的特点得到广泛应用,发射率是影响辐射测温精度的主要参数。实际条件中,不同物体、相同物体不同表面温度及表面状况其发射率是不同的。为获得实际物体的表面波段法向发射率,提高测温精度,采用红外热像仪对其进行测量。在介绍红外热像仪测温原理的基础上,通过分析得出红外热像仪测量发射率的方法。由于红外热像仪探测器、工作波段和测温范围的不同,发射率计算公式中n值也是不同的,对应用的红外热像仪在不同测温范围内的n值进行了计算。应用红外热像仪和比色测温仪对高温陶瓷表面波段法向发射率进行了测量,并对其进行了验证。实验结果表明该方法测得的表面波段法向发射率是可靠的,其修正后测温误差小于1%。
[Abstract]:Radiation temperature measurement method is widely used because of its fast response speed and wide range of temperature measurement. Emissivity is the main parameter that affects the accuracy of radiation temperature measurement. In the actual conditions, the emissivity of different objects and different surface temperatures and surface conditions are different. In order to obtain the normal emissivity and improve the accuracy of temperature measurement, the infrared thermal imager is used to measure the real object. On the basis of introducing the principle of infrared thermal imager, the method of measuring emissivity of infrared thermal imager is obtained through analysis. Because of the difference of working band and temperature range of infrared thermal imager, n value in emissivity formula is also different. The n value of infrared thermal imager is calculated in different temperature range. The normal emissivity of the surface band of high temperature ceramics was measured by infrared thermal imager and colorimetric thermometer. The experimental results show that the normal emissivity of the surface band measured by this method is reliable, and the corrected temperature measurement error is less than 1.
【作者单位】：中北大学仪器与电子学院;中北大学仪器科学与动态测试教育部重点实验室;
【基金】：国家自然科学基金面上项目(51575499,61473267) 技术基础科研项目(JSJC2013408C009)
【分类号】：TN219

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