射频电路多参数健康评估技术研究
发布时间：2019-03-30 22:54
【摘要】：随着电子技术的飞速发展,电子系统已广泛的应用在生产生活及航空航天的各个方面,其复杂度也不断增加,电子系统的关键模块或元件故障而引起的灾难性事故也是时有发生。因此,电子系统的健康程度评估也愈发的受到重视。目前,对于电子系统健康度尚无一种定量的评估方法,特别是对于多种参数监测下的电子系统综合健康度缺少有效的评估方法。针对该问题,论文主要从三个方面开展研究工作:1、针对加速退化实验耗时时间长、成本高的问题,论文提出了一种基于EDA仿真技术的射频电路性能退化仿真方法,结合故障模式影响分析,给出了影响射频电路健康状态的多个参数,利用仿真方法得到典型射频电路一系列关键参数的性能退化数据,最终确定使用S参数对射频电路的健康度进行评估。2、针对射频电路稳定性参数K变化微弱、难以有效监测早期性能退化的问题,论文采用一种HMM模型对射频电路的退化趋势进行监测,通过KL距离将微弱的性能退化参数转化为变化较为明显的退化趋势,从而增强了系统的退化趋势分析能力。3、提出了一种性能退化轨迹曲线相似度的射频电路健康评估及预测方法,选择一种符合度较高的模型对性能退化数据进行拟合,并使用拟合得到的性能退化轨迹曲线对射频电路的寿命进行预测。通过对射频电路的性能退化数据进行分析,明确了该用何种模型对性能退化数据进行拟合并给出了评价拟合模型的评价标准。同时,给出了性能退化轨迹与原始数据的退化轨迹之间的相似度的计算公式,并将其应用在了射频电路的健康评估及预测当中。经过实例验证,该方法能够对射频电路的健康状态进行较为准确的评估,利用该方法对射频电路进行预测得到的寿命,比直接使用性能退化轨迹得到的寿命更贴近真实值。
[Abstract]:With the rapid development of electronic technology, electronic system has been widely used in various aspects of production, life and aerospace, and its complexity is also increasing. Catastrophic accidents caused by the failure of key modules or components of an electronic system also occur from time to time. Therefore, the assessment of the health of electronic systems is being paid more and more attention. At present, there is no quantitative evaluation method for the health degree of electronic system, especially for the comprehensive health degree of electronic system monitored by a variety of parameters. In order to solve this problem, this paper focuses on three aspects: 1. Aiming at the long time-consuming and high cost of accelerated degradation experiment, a simulation method of RF circuit performance degradation based on EDA simulation technology is proposed in this paper. Combined with fault mode impact analysis, several parameters affecting the health state of RF circuit are given. The performance degradation data of a series of key parameters of typical RF circuit are obtained by simulation method. Finally, S parameters are used to evaluate the health of RF circuits. 2. For the weak variation of stability parameters K of RF circuits, it is difficult to effectively monitor the early performance degradation. In this paper, a HMM model is used to monitor the degradation trend of RF circuits. Through the KL distance, the weak performance degradation parameters are transformed into the obvious degradation trend, thus enhancing the degradation trend analysis ability of the system. In this paper, a health assessment and prediction method for RF circuits with similarity of performance degradation trajectory curves is proposed, and a high coincidence model is selected to fit the performance degradation data. The life of RF circuit is predicted by the fitting performance degradation trajectory curve. By analyzing the performance degradation data of RF circuits, it is clear which model should be used to simulate and merge the performance degradation data, and the evaluation standard of the evaluation fitting model is given. At the same time, the formula to calculate the similarity between the performance degradation trajectory and the original data degradation trajectory is given and applied to the health evaluation and prediction of RF circuits. An example shows that this method can accurately evaluate the health status of RF circuits. The life of RF circuits predicted by this method is closer to the real value than that obtained from the direct use of performance degradation trajectory.
【学位授予单位】：电子科技大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN710
，
本文编号：2450566
[Abstract]:With the rapid development of electronic technology, electronic system has been widely used in various aspects of production, life and aerospace, and its complexity is also increasing. Catastrophic accidents caused by the failure of key modules or components of an electronic system also occur from time to time. Therefore, the assessment of the health of electronic systems is being paid more and more attention. At present, there is no quantitative evaluation method for the health degree of electronic system, especially for the comprehensive health degree of electronic system monitored by a variety of parameters. In order to solve this problem, this paper focuses on three aspects: 1. Aiming at the long time-consuming and high cost of accelerated degradation experiment, a simulation method of RF circuit performance degradation based on EDA simulation technology is proposed in this paper. Combined with fault mode impact analysis, several parameters affecting the health state of RF circuit are given. The performance degradation data of a series of key parameters of typical RF circuit are obtained by simulation method. Finally, S parameters are used to evaluate the health of RF circuits. 2. For the weak variation of stability parameters K of RF circuits, it is difficult to effectively monitor the early performance degradation. In this paper, a HMM model is used to monitor the degradation trend of RF circuits. Through the KL distance, the weak performance degradation parameters are transformed into the obvious degradation trend, thus enhancing the degradation trend analysis ability of the system. In this paper, a health assessment and prediction method for RF circuits with similarity of performance degradation trajectory curves is proposed, and a high coincidence model is selected to fit the performance degradation data. The life of RF circuit is predicted by the fitting performance degradation trajectory curve. By analyzing the performance degradation data of RF circuits, it is clear which model should be used to simulate and merge the performance degradation data, and the evaluation standard of the evaluation fitting model is given. At the same time, the formula to calculate the similarity between the performance degradation trajectory and the original data degradation trajectory is given and applied to the health evaluation and prediction of RF circuits. An example shows that this method can accurately evaluate the health status of RF circuits. The life of RF circuits predicted by this method is closer to the real value than that obtained from the direct use of performance degradation trajectory.
【学位授予单位】：电子科技大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN710
，
本文编号：2450566
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