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毫秒脉冲激光损伤CCD探测器的实验研究

发布时间:2019-04-16 19:21
【摘要】:为了研究行间转移型彩色面阵CCD在毫秒脉冲激光辐照下的损伤效果,采用实验研究的方法,测量了不同能量密度的激光作用下,CCD表面中心点温度、受损区域面积、深度及CCD内部复位时钟信号和阻抗值的变化,结合CCD输出图像中出现不可恢复的焦斑及黑白雪花现象,对彩色面阵CCD在毫秒脉冲激光作用下的损伤效果进行了分析。结果表明,在毫秒脉冲激光的辐照作用下,行间转移型彩色面阵CCD内部结构会产生不同程度的烧蚀,当能量密度达到23.49J/cm~2时,烧蚀深度直达基底层,致使CCD内部信号传输通道断开,漏电流增加,最终造成CCD无信号输出,完全损坏。该研究对CCD探测器在强激光作用下的损伤效果研究是有帮助的。
[Abstract]:In order to study the damage effect of interrow transfer color array CCD irradiated by millisecond pulse laser, the temperature of the center point of CCD surface and the area of the damaged area were measured by the method of experimental study under the action of laser with different energy density. Based on the changes of depth and internal reset clock signal and impedance of CCD, combined with the irreparable focal spot and black-and-white snowflake in CCD output image, the damage effect of color area array CCD under millisecond pulse laser is analyzed. The results show that under the irradiation of millisecond pulse laser, the interior structure of the interrow transfer color array CCD will be ablated in varying degrees. When the energy density reaches 23.49J/cm~2, the ablation depth will reach the base layer directly. CCD internal signal transmission channel is disconnected, leakage current increases, resulting in CCD signal-free output, completely damaged. This study is helpful to study the damage effect of CCD detector under the action of high power laser.
【作者单位】: 长春理工大学理学院光学系;
【分类号】:TN386.5

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