低速小规模数模混合集成电路测试板设计

发布时间：2019-04-19 11:30

【摘要】：随着电子科技的发展,集成电路已经是日常生活中不可或缺的东西,因此对集成电路的研究是现在以及未来研究的一个热点问题。集成电路的测试是混合集成电路研究中的一个重点环节,它可以保证电路的设计达到预期指标。本课题是低速小规模数模混合集成电路测试板的设计。其主要内容是以现有的各功能芯片为依据,使用模块化的设计思路,设计出一款可靠性较高的集成电路测试板。该测试板可以满足部分低速小规模混合集成电路的测试需求,与现在市场上常见的集成电路测试仪相比,具有操作简单,造价低,实用性强等特点。本论文首先介绍了混合集成电路测试系统的发展现状,然后介绍了测试板设计涉及到的相关技术知识。在本文的核心部分,详细介绍了混合集成电路测试硬件电路板的设计,包括混合集成电路测试用到的数字捕获模块(DCI),模拟捕获模块(ACI),程控电源的设计,高精度模拟测量仪的设计等,并且分别介绍了每个模块的逻辑设计。论文最后对一款典型数模混合集成电路(DAC)的相关参数进行了测试,说明了测试板电路的实际应用。
[Abstract]:With the development of electronic science and technology, integrated circuit has become an indispensable thing in daily life. Therefore, the research on integrated circuit is a hot topic now and in the future. The test of integrated circuit is an important part in the research of hybrid integrated circuit, which can ensure the design of the circuit to meet the expected target. This paper is the design of low-speed and small-scale digital-analog hybrid integrated circuit test board. The main content of this paper is to design an integrated circuit test board with high reliability based on the existing functional chips and modular design idea. The test board can meet the testing requirements of some low-speed and small-scale hybrid integrated circuits. Compared with the common integrated circuit tester on the market at present, the test board has the characteristics of simple operation, low cost and strong practicability. This paper first introduces the development of the hybrid integrated circuit test system, and then introduces the related technical knowledge involved in the design of the test board. In the core part of this paper, the design of the test hardware circuit board of the hybrid integrated circuit is introduced in detail, including the design of the digital acquisition module (DCI), analog acquisition module (ACI), program control power supply used in the test of the hybrid integrated circuit. The design of high precision analog measuring instrument is introduced, and the logic design of each module is introduced. Finally, the related parameters of a typical digital-analog hybrid integrated circuit (DAC) are tested, and the practical application of the test board circuit is illustrated.
【学位授予单位】：苏州大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN407

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