高速折叠插值ADC采样时间失配误差校准电路设计
[Abstract]:Compared with the full parallel architecture ADC, folding interpolation ADC (Analog-to-Digital Converter, Analog-to-Digital Converter) not only obtains high speed, but also reduces the area and power consumption of the chip, and has been widely used in high-speed ADC. However, nowadays, single-chip ADC is difficult to meet the requirements of high sampling rate, so the time interleaving structure ADC is more and more adopted. However, there are all kinds of errors between the sub-ADC, which will have a great impact on the performance of ADC. Among them, the sampling timing error between channels is the most critical and difficult to calibrate, which has become the focus of research in this field. In this paper, the research status of mismatch error calibration technology between time interleaving ADC channels is investigated in detail. For 8 bits, single channel sampling frequency 500MHz, four channel folding interpolation time interleaving ADC, The influence of errors between subchannels on the output results of ADC is analyzed, and the necessity of designing sampling time mismatch error calibration circuit is demonstrated by theoretical analysis and behavior level modeling. It is concluded that the sampling time series deviation between the channels of the time interleaving ADC described in this paper should be less than 2.5 PS. The typical calibration technology of sampling time mismatch error is studied. on this basis, the calibration circuit which uses full difference analog calibration loop to convert the sampling timing deviation into duty cycle information is determined, including shaping circuit and edge detection circuit. Full difference continuous time Integrator, transconductive amplifier, etc. The edge detection circuit converts the sampling timing deviation into duty cycle information, and introduces a manual adjustment module into the circuit. By changing the current size of the circuit, the detected duty cycle information can be adjusted in the background. In the Integrator circuit, the selection and design of the operational amplifier architecture and the determination of the RC constant of the Integrator are determined according to the gain and swing, and the very linear transconductivity gain is obtained by improving the linearity of the circuit by negative feedback in the transconductive amplifier. Finally, the calibration effect of the whole calibration loop is verified by simulation. In this paper, based on TSMC 0.18 渭 m CMOS process, the calibration circuit is simulated by Cadence Spectre software at 2V power supply voltage. The simulation results show that for the differential input clock signal of 1GHz, The four-channel sampling clock is its binary signal of different phases. when one of the 100ps is delayed, the calibration loop can automatically calibrate the sampling time interval of the output signal to 500.308ps. when the manual control word is further changed, the calibration loop can automatically calibrate the sampling time interval of the output signal to 500.308ps. when the manual control word is further changed, The sampling time interval is calibrated to 499.992ps, which meets the requirements of 8-bit four-channel time interleaving ADC for sampling timing error.
【学位授予单位】:合肥工业大学
【学位级别】:硕士
【学位授予年份】:2017
【分类号】:TN792
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