还原温度对石墨烯性能的影响

发布时间：2018-04-17 06:19

  本文选题：石墨烯 + 结构　； 参考：《辽宁工程技术大学学报(自然科学版)》2017年03期

【摘要】：采用天然鳞片石墨为原料,用氧化-还原法在不同还原温度制备石墨烯,通过XRD、SEM、恒流充放电等检测手段研究了不同工艺参数对石墨烯结构和电性能的影响.研究结果表明:石墨烯具有片层结构,其层间距随着还原温度的增加而减小,都约为0.35 nm;石墨烯的半峰宽呈现先减小后增大的趋势,在还原温度为80℃时有最小值,为7.903 rad.随着还原氧化石墨的温度增加,材料的首次放电电容、首次充放电效率和循环性能都呈现先增大后减小的趋势.材料r GO-80的首次放电电容量为141.1 F/g,500次循环后,样品保持了首次放电容量的87.9%.
[Abstract]:Graphene was prepared from natural flake graphite by oxidation-reduction method at different reduction temperatures. The effects of different process parameters on the structure and electrical properties of graphene were studied by means of XRDX SEM and constant current charge-discharge detection.The results show that graphene has a lamellar structure, and its interlayer spacing decreases with the increase of reduction temperature, which is about 0.35 nm, and the half peak width of graphene decreases first and then increases, with the minimum value of 7.903 radat 80 鈩，

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