石墨烯材料的光谱表征研究

发布时间：2018-06-13 06:44

  本文选题：石墨烯 + 光谱表征　； 参考：《太原理工大学》2017年硕士论文

【摘要】：石墨烯因具有独特的二维结构以及优异的性能,如高电荷迁移率、高透光率、高强度、高理论比表面积和优良的热传导性等,因而广泛应用于电子器件、储能器件、复合材料、传感器等领域。随着石墨烯制备和应用逐步进入工业规模化生产阶段,对石墨烯的准确测量的重要性日益凸显。不同制备方法生产的石墨烯厚度(层数)都是不均匀的,所得到的石墨烯质量也不相同。只有准确的对石墨烯进行表征,才能保证其性能和结构的研究和应用,才能为石墨烯的制备提供可靠的改进依据。石墨烯的光谱表征研究,有助于检测和控制石墨烯的质量,有效推动石墨烯在各个领域的广泛应用。目前可量产的石墨烯制备方法主要是化学气相沉积法(CVD)和氧化还原法,本文针对这两种方法制备的石墨烯薄膜和石墨烯粉体进行光谱表征研究。本文的主要研究内容包括:1.针对CVD石墨烯薄膜的杂质的快速准确表征进行了研究。通过拉曼成像对石墨烯薄膜进行检测,利用G峰峰位、2D峰峰位以及IG/I2D的拉曼成像图来识别石墨烯薄膜的层数;利用石墨烯薄膜的光学图像以及IG和I2D的拉曼成像图来识别单层石墨烯和折叠双层石墨烯;利用ID/IG,来判断出无定形碳和结晶碳等化学杂质;利用2D峰峰位、半峰宽和IG/I2D的拉曼成像图来研究石墨烯的边缘效应。通过原子力显微镜对拉曼成像的表征结果进行验证。拉曼成像技术可以实现CVD石墨烯薄膜层数测量、化学杂质检测、折叠结构判定以及边缘效应的研究,为工厂提供了一种可以快速、简单、准确、无损分析的技术来检测和控制石墨烯薄膜的质量。2.针对温度对堆叠双层石墨烯的影响进行了研究。通过拉曼光谱表征研究了室温下不同层数的堆叠石墨烯薄膜和CVD生长石墨烯薄膜的层间耦合状态;不同温度下SiO2/Si基底对堆叠双层石墨烯和CVD双层石墨烯的影响;温度对堆叠双层石墨烯/基底和CVD双层石墨烯/基底层间耦合状态的影响,并计算了两种材料分别在25℃-250℃和250℃-400℃之间的G峰峰位的温度系数以及2D峰半峰宽的温度系数。3.针对氧化石墨烯和还原氧化石墨烯粉体的区别进行了研究。使用拉曼光谱、红外光谱、紫外-可见吸收光谱对氧化石墨烯和还原氧化石墨烯进行检测分析,研究了二者在不同光谱表征中的区别。4.针对共焦显微拉曼光谱仪空间分辨率进行了研究。利用尺寸为500 nm的聚苯乙烯微球(NIST标准物质)分别测试了相同条件下的真共焦和赝共焦显微拉曼的三维成像图。通过聚苯乙烯微球的三维拉曼成像实验拟合出真共焦和赝共焦显微拉曼在此条件下的横向和轴向空间分辨率,通过理论计算公式求出同等条件下的横向和轴向空间分辨率,并对两种方式得出的空间分辨率进行比较。
[Abstract]:Graphene is widely used in electronic devices, energy storage devices and composites because of its unique two-dimensional structure and excellent properties, such as high charge mobility, high transmittance, high intensity, high theoretical surface area and excellent thermal conductivity. Sensors, etc. With the preparation and application of graphene, the importance of accurate measurement of graphene is becoming more and more important. The thickness (number of layers) of graphene produced by different preparation methods is not uniform, and the quality of graphene obtained is also different. Only by accurately characterizing graphene can the study and application of its properties and structures be guaranteed and the reliable basis for the preparation of graphene can be provided. The spectroscopic characterization of graphene is helpful to detect and control the quality of graphene and promote the wide application of graphene in various fields. At present, the main preparation methods of graphene are chemical vapor deposition (CVD) and redox method. In this paper, the graphene thin films and graphene powders prepared by these two methods are characterized by spectrum. The main contents of this paper include: 1. The fast and accurate characterization of impurities in CVD graphene films was studied. The graphene films were detected by Raman imaging, and the layers of graphene films were identified by G peak 2D peak position and IGR / I2D Raman imaging. Using optical images of graphene films and Raman images of IG and I2D to identify monolayer graphene and folded bilayer graphene, using ID / IGR to determine chemical impurities such as amorphous carbon and crystalline carbon, using 2D peak position, The edge effect of graphene is studied by half peak width and Raman imaging of IGR 2 D. The characterization results of Raman imaging were verified by atomic force microscope (AFM). Raman imaging technology can be used to measure the number of layers of CVD graphene films, detect chemical impurities, determine the folding structure and study the edge effect. It provides a fast, simple and accurate method for manufacturing. Nondestructive analysis techniques to detect and control the quality of graphene films. The effect of temperature on stacking double layer graphene was studied. The interlaminar coupling states of stacked graphene films with different layers at room temperature and that of CVD grown graphene films were investigated by Raman spectroscopy, and the effects of Sio _ 2 / Si substrate on stacked bilayer graphene and CVD bilayer graphene were investigated at different temperatures. The effect of temperature on the coupling state between stacked bilayer graphene / substrate and CVD bilayer graphene / substrate, The temperature coefficients of G peak and 2D peak width between 25 鈩，

本文编号：2013102