Influence of Process and Heat Treatment on the Microstructur
发布时间:2020-12-07 15:05
增材制造,又称3D打印技术,深刻地改变了零部件成型方式。本文对比了两种工艺EBM和SLM焊接Ti-6Al-4V合金,并详细研究了其对材料微观结构和力学性能的影响。另外,本文还讨论了两种热处理对材料特性的影响:热均压法(HIP)和退火。同时使用了电子背散射衍射(EBSD)和X射线衍射对材料的微观结构进行表征,结果显示EBM带来了α层片中β残留,而SLM产生了马氏体α’结构。热处理都使得材料的刚度和韧性得到提升。EBM样本HIP处理后极限拉伸强度(UTS)提升了21%。然而SLM样本退火后极限拉伸强度下降了20%,这主要由于从马氏体α’转变为lamellarα+β带来的微观结构的改变。
【文章来源】:上海交通大学上海市 211工程院校 985工程院校 教育部直属院校
【文章页数】:62 页
【学位级别】:硕士
【文章目录】:
Abstract
摘要
1.Introduction
1.1.Introduction to Additive Manufacturing
1.1.1.Electron Beam Melting
1.1.2.Selective Laser Melting
1.2.Ti-6Al-4V:Interesting Properties for Additive Manufacturing
2.Experiments
2.1.EBSD:Method and Protocol
2.1.1.Introduction to EBSD
2.1.2.Experimental Protocol and Parameters
2.1.3.EBSD Data analysis with OIM 7
2.2.X-Ray Diffraction:Method and Protocol
2.2.1.Introduction to Synchrotron Radiation
2.2.2.Experimental Protocol and Parameters
2.2.3.XRD data Treatment:From a2D Pattern to a peaks identification
3.Results and Discussion
3.1.Identification of the Microstructure
3.1.1.Microscopy:Picturing the phases with grain maps
3.1.2.XRD Identification of the different phases
3.1.3.Discussion about the Microstructure: α, α’andβ peaks
3.2.Analysis of the mechanical properties
3.2.1.Adapting the Data Spreading
3.2.2.Analysis of the Ductility
3.2.3.Analysis of the Stiffness:Young’s Modulus calculation
3.2.4.Tensile properties:UTS and Fracture Stress
Conclusion
Acknowledgements
Appendix
Control Sample Data
Fit2D Analysis Parameters
Initial State2D Pattern from XRD
OIM Grain Size Analysis
XRD data:Calculation of the Young Modulus,Poisson ratio
XRD Data:Intensity for each identified Diffracted Peaks
References
本文编号:2903467
【文章来源】:上海交通大学上海市 211工程院校 985工程院校 教育部直属院校
【文章页数】:62 页
【学位级别】:硕士
【文章目录】:
Abstract
摘要
1.Introduction
1.1.Introduction to Additive Manufacturing
1.1.1.Electron Beam Melting
1.1.2.Selective Laser Melting
1.2.Ti-6Al-4V:Interesting Properties for Additive Manufacturing
2.Experiments
2.1.EBSD:Method and Protocol
2.1.1.Introduction to EBSD
2.1.2.Experimental Protocol and Parameters
2.1.3.EBSD Data analysis with OIM 7
2.2.X-Ray Diffraction:Method and Protocol
2.2.1.Introduction to Synchrotron Radiation
2.2.2.Experimental Protocol and Parameters
2.2.3.XRD data Treatment:From a2D Pattern to a peaks identification
3.Results and Discussion
3.1.Identification of the Microstructure
3.1.1.Microscopy:Picturing the phases with grain maps
3.1.2.XRD Identification of the different phases
3.1.3.Discussion about the Microstructure: α, α’andβ peaks
3.2.Analysis of the mechanical properties
3.2.1.Adapting the Data Spreading
3.2.2.Analysis of the Ductility
3.2.3.Analysis of the Stiffness:Young’s Modulus calculation
3.2.4.Tensile properties:UTS and Fracture Stress
Conclusion
Acknowledgements
Appendix
Control Sample Data
Fit2D Analysis Parameters
Initial State2D Pattern from XRD
OIM Grain Size Analysis
XRD data:Calculation of the Young Modulus,Poisson ratio
XRD Data:Intensity for each identified Diffracted Peaks
References
本文编号:2903467
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