单钩波形板分离器内二次携带机理分析

发布时间：2018-04-25 11:12

本文选题：波形板分离器 + 二次携带　；参考：《原子能科学技术》2016年05期

【摘要】：通过理论分析与三维数值模拟研究了实际运行工况下单钩波形板分离器内二次携带机理。采用Realizable k-ε湍流模型对波形板内气相流场进行数值模拟,利用离散相模型结合涡交互模型对水滴运动进行计算,根据壁面水膜运动方程求解水膜的速度与厚度分布;依据理论分析,对可能形成二次水滴的4种方式进行判定。结果表明:波形板内发生气体动力造成的水滴破碎与水滴撞击水膜产生飞溅的可能性较低,但较冷态工况的可能性高;水膜主要集中在波形板的前两级,随入口蒸汽速度或湿度的增加,水膜增厚并向下游移动;将水膜剥落和水膜分离的判别式进行统一,并证实波形板二次携带主要由水膜的剥落和分离造成,且相较水膜剥落,钩峰处的水膜分离更易发生。
[Abstract]:Through theoretical analysis and 3D numerical simulation, the mechanism of secondary carrying in the order hook waveform plate separator is studied. The Realizable k- 蔚 turbulence model is used to simulate the gas phase flow field in the wavy plate, the discrete phase model and the vortex interaction model are used to calculate the water droplet motion, and the velocity and thickness distribution of the water film is calculated according to the motion equation of the water film on the wall. On the basis of theoretical analysis, four ways of forming secondary water droplets are determined. The results show that the possibility of water droplet breakup and water droplet impingement on water film is lower, but higher than that of cold condition, and the water film is mainly concentrated in the first two stages of the wave plate. With the increase of inlet steam velocity or humidity, the water film thickened and moved downstream, the discriminant of water film flaking and water film separation was unified, and it was proved that the second carrying of the wavy plate was mainly caused by the spalling and separation of the water film, and the flaking of the water film was more than that of the water film. Water membrane separation at the hook peak is more likely to occur.
【作者单位】：核动力运行研究所;中核武汉核电运行技术股份有限公司;
【分类号】：O35

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