基于ZYNQ的智能卡测试仪的研发和设计
发布时间：2019-01-20 18:06
【摘要】：智能卡(SmartCard)即IC卡,是内嵌有集成电路芯片的卡片。随着物联网技术和集成电路产业的发展,智能卡越来越普遍地应用于生产生活的方方面面。其中非接触式智能卡技术(NFC)的大力推广和应用即将成为今后几年的科技发展趋势。在智能卡领域,读卡器和智能卡设备的适配性越来越多地成为智能卡推广和走向成熟发展的瓶颈。由于不同生产厂家、不同工艺水平、不同技术标准,上市的智能卡设备和智能卡读卡器并不能完全兼容和匹配。无论是接触式智能卡设备还是非接触式智能卡设备,硬件和软件的故障检测和故障处理能力都是十分重要的。传统的测试方法采用了分立的MCU芯片和专用芯片分别用来支持协议层和物理层的应用,相关的工作参数已经固化,但是在系统的可扩展性方面和传输速率方面有所欠缺。本文分别针对接触式智能卡和非接触式智能卡(特指NFC技术)提出了一种具有高度灵活性的智能卡仿真测试系统的设计和实现。在一定范围内,可以对载波频率、调制深度等技术指标进行控制,兼容不同的应用层协议,实现测试的可定制化和可复用特性。本论文的研究内容和创新点如下1.针对接触式智能卡,依照ISO/IEC7816协议,实现了智能卡的模拟系统,可以与智能卡读卡器设备相交互,实现特定内容命令的检测和故障容错功能校验,可以对特定应用及其协议命令进行定制化测试。2.针对非接触式智能卡,依照ISO/IEC14443协议,仿真了智能卡读卡器的系统,实现在可配置工作频率、调制深度和其他指标的情况下,可以与NFC标签设备进行通信,检测NFC标签设备在不同参数条件下的适配性。3.智能卡仿真测试系统的硬件平台为ARM+FPGA架构的ZYNQ-7000 SOC。这样的设计充分发挥了器件的优势,同时应用了高性能、低延迟的AXI片内总线和DMA传输方式。相比于传统的仿真测试方法,基于ZYNQ-7000 SOC的解决方案可以在不改变硬件电路的情况下,通过修改代码来完成新的智能卡功能。软硬件的可重构特性保证了它也可以满足未来的新型智能卡设备的测试需求。
[Abstract]:Smart card (SmartCard), or IC card, is a card embedded with integrated circuit chips. With the development of Internet of things technology and integrated circuit industry, smart cards are more and more widely used in all aspects of production and life. The promotion and application of contactless smart card technology (NFC) will be the trend of science and technology development in the next few years. In the field of smart card, the adaptability of card reader and smart card equipment has become the bottleneck of the popularization and development of smart card. Due to different manufacturers, different technology levels and different technical standards, the available smart card devices and smart card readers are not fully compatible and compatible. Whether contact smart card equipment or contactless smart card equipment, hardware and software fault detection and fault processing capabilities are very important. The traditional test method uses separate MCU chip and special chip to support the application of protocol layer and physical layer respectively. The related working parameters have been solidified, but the system scalability and transmission rate are not enough. This paper presents the design and implementation of a smart card simulation and testing system with high flexibility for contact smart card and contactless smart card (NFC technology in particular). In a certain range, the carrier frequency, modulation depth and other technical specifications can be controlled, compatible with different application layer protocols, and the test can be customized and reusable. The contents and innovations of this thesis are as follows. According to ISO/IEC7816 protocol, the simulation system of smart card is implemented for contact smart card, which can interact with smart card reader equipment, and realize the detection of specific content command and fault tolerance function check. Can be customized for specific applications and their protocol commands. 2. For contactless smart card, according to ISO/IEC14443 protocol, the system of smart card reader is simulated, which can communicate with NFC tag device under the condition of configurable working frequency, modulation depth and other indexes. Test the adaptability of NFC tag equipment under different parameters. 3. 3. The hardware platform of smart card simulation test system is ZYNQ-7000 SOC. based on ARM FPGA architecture This design gives full play to the advantages of the device, and uses high performance, low delay AXI on-chip bus and DMA transmission mode. Compared with the traditional simulation test method, the solution based on ZYNQ-7000 SOC can complete the new smart card function by modifying the code without changing the hardware circuit. The reconfigurable property of hardware and software ensures that it can also meet the testing requirements of new smart card devices in the future.
【学位授予单位】：北京邮电大学
【学位级别】：硕士
【学位授予年份】：2016
【分类号】：TN409;TP391.9
本文编号：2412264
[Abstract]:Smart card (SmartCard), or IC card, is a card embedded with integrated circuit chips. With the development of Internet of things technology and integrated circuit industry, smart cards are more and more widely used in all aspects of production and life. The promotion and application of contactless smart card technology (NFC) will be the trend of science and technology development in the next few years. In the field of smart card, the adaptability of card reader and smart card equipment has become the bottleneck of the popularization and development of smart card. Due to different manufacturers, different technology levels and different technical standards, the available smart card devices and smart card readers are not fully compatible and compatible. Whether contact smart card equipment or contactless smart card equipment, hardware and software fault detection and fault processing capabilities are very important. The traditional test method uses separate MCU chip and special chip to support the application of protocol layer and physical layer respectively. The related working parameters have been solidified, but the system scalability and transmission rate are not enough. This paper presents the design and implementation of a smart card simulation and testing system with high flexibility for contact smart card and contactless smart card (NFC technology in particular). In a certain range, the carrier frequency, modulation depth and other technical specifications can be controlled, compatible with different application layer protocols, and the test can be customized and reusable. The contents and innovations of this thesis are as follows. According to ISO/IEC7816 protocol, the simulation system of smart card is implemented for contact smart card, which can interact with smart card reader equipment, and realize the detection of specific content command and fault tolerance function check. Can be customized for specific applications and their protocol commands. 2. For contactless smart card, according to ISO/IEC14443 protocol, the system of smart card reader is simulated, which can communicate with NFC tag device under the condition of configurable working frequency, modulation depth and other indexes. Test the adaptability of NFC tag equipment under different parameters. 3. 3. The hardware platform of smart card simulation test system is ZYNQ-7000 SOC. based on ARM FPGA architecture This design gives full play to the advantages of the device, and uses high performance, low delay AXI on-chip bus and DMA transmission mode. Compared with the traditional simulation test method, the solution based on ZYNQ-7000 SOC can complete the new smart card function by modifying the code without changing the hardware circuit. The reconfigurable property of hardware and software ensures that it can also meet the testing requirements of new smart card devices in the future.
【学位授予单位】：北京邮电大学
【学位级别】：硕士
【学位授予年份】：2016
【分类号】：TN409;TP391.9
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