陶瓷基片外观检测及分拣系统设计
[Abstract]:In the composition materials of resistance and capacitance, the size and surface smoothness of ceramic substrate determine the resistance value and capacitance capacity. At the same time, with the development of electronic industry, the requirement of fabrication of resistance and capacitance becomes smaller and smaller. It makes the detection of ceramic substrate have higher requirements. At present, the detection of ceramic substrates on the market is to overcome the defects of manual inspection by visual processing, but most methods use pixel coordinates directly to calculate parameters, which requires a large amount of data calculation in the system. And through the precise cooperation of the hardware to complete the image acquisition. In this paper, the ceramic substrate detector is designed to detect the smooth surface of ceramic substrate, the size of the substrate, and the verticality of the rectangular substrate, on the basis of this, the ceramic substrate detector is designed to detect the smoothness of the surface of the ceramic substrate and the dimension of the substrate. A sorting mechanism for automatic sorting of products is designed based on the testing results. The main contents are as follows: (1) the common defects and the size of the substrate are analyzed, and the defects in the substrate are judged and classified according to the defect characteristic parameters, and the detection task of the detector is completed. The PPI communication protocol, which has good stability and high transmission efficiency, is adopted in the system. The test results obtained from the embedded system are transmitted to the PLC, and the automatic sorting function is completed through the control of the servo motor, and the sorting mechanism is designed. Finally, using miniGUI to make man-machine interface to complete the whole process of human-computer interaction. (2) in the process of substrate detection, the system in order to overcome the traditional error in the calculation of defect parameters, Firstly, the method of pixel coordinate calculation is used to get the first result. Then the center of gravity of the substrate and the distance from the farthest point and the nearest point of the center of gravity are calculated to calculate the related parameters and get the result of calculation. Finally, the final calculation parameters are obtained by comparing them. (3) on the embedded platform, the real-time image acquisition program and the image processing program are used to obtain the single pixel width image of the substrate edge. (3) the system uses the real-time image acquisition program and the image processing program to obtain the single pixel width substrate edge image. The sub-pixel edge coordinates for parameter calculation are obtained by using the sub-pixel algorithm. (4) under the existing experimental conditions in the laboratory, the experimental platform of the system is built, and the control parts of the system are verified by experiments. The experimental results show that each part of the system can complete the corresponding system functions under the guidance of the relevant procedures. And verified that the design of the system can complete the detection and sorting functions of ceramic substrates within the specified time and error range, with the characteristics of low power consumption, low cost, convenient installation, high precision and good real-time performance, and so on. It can overcome many shortcomings of traditional detection.
【学位授予单位】:太原科技大学
【学位级别】:硕士
【学位授予年份】:2016
【分类号】:TQ174.6;TP391.41
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