小尺度表面粗糙度与介质吸收对介质折射率测量的影响（英文）

发布时间：2018-01-03 10:13

本文关键词：小尺度表面粗糙度与介质吸收对介质折射率测量的影响（英文）　出处：《光子学报》2017年04期 　论文类型：期刊论文

【摘要】：将介质表面的小尺度粗糙度等效为覆盖在理想光滑表面上的多层等厚折射率渐变的薄膜,并通过特征矩阵计算多层等效膜模型的P光反射率与入射角的关系.将吸收介质的折射率虚部带入菲涅尔公式进行计算.运用COMSOL Mutiphysics软件对表面粗糙度和介质吸收进行建模和仿真计算.计算结果表明,小尺度表面粗糙度与介质吸收都会导致折射率测量产生误差.分别考虑以布儒斯特角和全反角作为折射率测量的手段,为了得到优于10~(-5)的测量准确度,测量表面粗糙介质的折射率时,采用全反角进行判定;测量具有吸收效应的介质折射率时,采用布儒斯特角进行判定.
[Abstract]:The small scale roughness of the dielectric surface is equivalent to a multilayer film with graded refractive index of equal thickness covered on an ideal smooth surface. The relation between P-ray reflectance and incident angle of multilayer equivalent film model is calculated by eigenmatrix. The imaginary refractive index of absorbing medium is introduced into Fresnel formula. COMSOL is used. The surface roughness and medium absorption are modeled and simulated by Mutiphysics software. Small-scale surface roughness and medium absorption will lead to errors in refractive index measurement. Brewster angle and total inverse angle are considered as the means of refractive index measurement respectively. In order to obtain the accuracy of measurement, the total inverse angle is used to determine the refractive index of rough surface medium. When measuring refractive index of medium with absorption effect, Brewster angle is used to judge.
【作者单位】：国防科学技术大学光电科学与工程学院;
【基金】：The Research Project of National University of Defense Technology(No.ZK16-03-21) the National Natural Science Foundation of China(Nos.61205157,61405250)
【分类号】：O435.1
【正文快照】： Foundation item:The Research Project of National University of Defense Technology(No.ZK16-03-21)and the National Natural ScienceFoundation of China(Nos.61205157,61405250)1-10021400 IntroductionFresnel′s equations give the reflectance R,the transmittance

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