基于光双边带调制的高精度光矢量分析技术

发布时间：2018-06-13 09:53

本文选题：光矢量分析 + 双边带调制　；参考：《南京航空航天大学》2017年硕士论文

【摘要】：超大容量光通信、慢光存储、超高精度计量等前沿研究,要求光器件和光子集成芯片具有多维(包括幅度、相位和偏振)、高精细的频谱操控能力。在研制、生产和应用这些光器件和光芯片的过程中,必须精细测量出其在多个维度上的光谱响应。目前,仅有基于光单边带调制的光矢量分析技术可实现光器件多维光谱响应的高精细测量,但该方法具有测量带宽小、非线性误差大、无法测量带通器件等缺点。针对这些关键问题,本文提出并研究了基于光双边带调制的光矢量分析技术,具体研究工作如下:首次提出了基于光双边带调制的光矢量分析技术,通过对光载波移频实现非对称光双边带调制,经光电转换后使两个一阶边带所携带的响应信息分别转换到两个不同频率的微波信号上,采用微波幅相检测即可获取待测器件在光载波两侧的频谱响应。相比于传统的基于光单边带扫频的光矢量分析技术,本方法突破了测量系统中光电子器件和微波器件工作带宽的限制,将单通道测量带宽提升了一倍;由于所检测信号与高阶边带所产生的拍频信号在频率上不同,测量结果不会受到高阶边带的影响。提出并实验论证了三种基于光双边带调制的光矢量分析技术方案。基于声光移频法与非对称双边带调制的光矢量分析技术可测量幅度响应,且其动态范围和信噪比高,适合测量带通光器件;基于受激布里渊散射与非对称双边带调制的光矢量分析技术可同时测量幅度与相位响应,可实现较大的边带抑制比,残留边带对系统影响较小;基于双驱动调制器与非对称双边带调制的光矢量分析技术可同时测量幅度与相位响应,结构简单,且测量结果无明显畸变点。此外,本文对测量系统的性能进行了研究,通过解析分析和数值仿真相结合的方式分别研究了非对称光双边带信号中残留边带、原载波和高阶边带对光矢量分析准确度的影响。本文还提出了关键测量性能提升技术,基于光频梳的测量带宽拓展技术可实现测量带宽大于1THz的光矢量分析,共模噪声抑制技术可消除光源功率波动和电光调制器非线性等对测量结果的影响。综上所述,本文提出了新型光矢量分析方案,即基于光双边带调制的光矢量分析技术,实现了多维度、大测量带宽、高精度的光矢量分析,并采用理论分析与实验验证相结合的方式进行了初步研究。可在高精细光器件和创新光子集成芯片的研制和应用中获取新数据,从而有力支撑前沿研究领域的创新和突破。
[Abstract]:Ultra large capacity optical communication, slow light storage, ultra high precision measurement, etc., require optical devices and photonic integrated chips to have multidimensional (including amplitude, phase and polarization) and high precision spectrum manipulation ability. In the development, production and application of these optical devices and optical chips, it is necessary to carefully measure the spectral ringing in many dimensions. At present, only optical vector analysis based on optical single side band modulation can achieve high precision measurement of multidimensional spectral response of optical devices. However, this method has the disadvantages of small measurement bandwidth, large nonlinear error and can not measure band-pass devices. Technology and specific research work are as follows: the optical vector analysis technology based on optical bilateral band modulation is proposed for the first time. The modulation of asymmetrical optical bilateral band is realized by frequency shift of optical carrier. After photoelectric conversion, the response information carried by two first order side bands is converted to two different frequency microwave signals, and microwave amplitude phase detection can be used. The spectral response of the device to be measured on both sides of the optical carrier is obtained. Compared to the traditional optical vector analysis based on optical single side band sweep, this method breaks through the limitation of the bandwidth of the optoelectronic devices and microwave devices in the measurement system, doubles the bandwidth of the single channel measurement, and the beat frequency produced by the detected signal and the high order band band. The signal is different in frequency and the result will not be influenced by the high order band. Three optical vector analysis techniques based on optical bilateral band modulation are proposed and demonstrated. The amplitude response of the optical vector analysis technique based on the acoustooptic frequency shift and the asymmetric bilateral band modulation can be measured, and its dynamic range and signal to noise ratio are high, suitable for the measuring band. Optical devices; optical vector analysis based on stimulated Brillouin scattering and asymmetric bilateral band modulation can measure both amplitude and phase response simultaneously, which can achieve larger side band rejection ratio. Residual edges have little influence on the system; optical vector analysis technology based on dual drive modulator and asymmetric bilateral band modulation can measure both amplitude and phase simultaneously. In addition, the performance of the measurement system is studied. The influence of the residual band, the original carrier and the high order band on the accuracy of the optical vector analysis is studied by the combination of analytic analysis and numerical simulation. The key measurement performance enhancement technology, based on the optical frequency comb measurement bandwidth expansion technology can measure the optical vector analysis of the bandwidth greater than 1THz, and the common mode noise suppression technology can eliminate the influence of the power fluctuation of the light source and the nonlinearity of the electro-optic modulator on the measurement results. In the above description, a new optical vector analysis scheme, based on light, is proposed. The optical vector analysis technology of bilateral band modulation has realized the multi-dimensional, large measurement bandwidth, high precision optical vector analysis, and a preliminary study is carried out by combining theoretical analysis with experimental verification. New data can be obtained in the development and application of high precision light devices and innovative photonic integrated chips, which can strongly support the frontier research. Innovations and breakthroughs in the field.
【学位授予单位】：南京航空航天大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TN929.1

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