ID-201单光子计数器计数模型研究

发布时间：2018-10-29 16:57

【摘要】：InGaAs半导体单光子探测器具备探测性能强,集成度高等优势,在光谱分析和量子通信等领域有广泛的应用.本文以ID Quantique公司出品的ID-201半导体单光子计数器为研究对象,结合计数器核心部件雪崩光电二极管的工作原理探究其计数光子时的内部过程,推导出每秒钟光子计数值和该计数器几个重要参数触发频率(trigger frequency),门脉冲宽度(gate width),门强制关闭时间(dead time),探测效率(detection efficiency)之间的数学表达式.推导过程着重分析了计数门脉冲的关闭效应对光子探测概率的影响.首先利用泊松分布求解光子计数值与探测效率(detection efficiency)之间的关系,然后将计数过程分成两大部分,分析计数结果与门强制关闭时间(dead time)之间关系.求解得表达式后,利用1550nm激光器作为ID-201的输入光源,在各种不同实验条件下,对该表达式的正确性进行了检验.
[Abstract]:InGaAs semiconductor single photon detector has many advantages such as high detection performance and high integration. It has been widely used in the field of spectrum analysis and quantum communication. In this paper, the single photon counter of ID-201 semiconductor produced by ID Quantique Company is taken as the research object, and the internal process of counting photon is explored by combining the working principle of avalanche photodiode, the core component of the counter. The mathematical expressions between the photon count value per second and several important parameters of the counter triggering frequency (trigger frequency), gate pulse width (gate width), gate forced closing time (dead time), detection efficiency (detection efficiency) are derived. The influence of the closing effect of counting gate pulse on the photon detection probability is analyzed. Firstly, Poisson distribution is used to solve the relationship between photon counting value and detection efficiency (detection efficiency), then the counting process is divided into two parts, and the relationship between counting results and gate forced closing time (dead time) is analyzed. After the expression is solved, the correctness of the expression is verified by using 1550nm laser as the input light source of ID-201 under various experimental conditions.
【作者单位】：南京大学电子科学与工程学院;
【分类号】：TH724

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