低照度CMOS图像传感器综合性能测试系统研制

发布时间：2018-06-20 01:33

本文选题：低照度CMOS + 信噪比　；参考：《南京理工大学》2017年硕士论文

【摘要】：低照度CMOS器件由于体积小、可昼夜工作等优点得到广泛应用,信噪比、增益、动态范围、满阱电荷和光谱响应等性能参数是CMOS成像器件的重要特性指标。本文围绕低照度CMOS图像传感器综合性能测试技术展开深入研究,研制了低照度CMOS图像传感器综合性能测试系统,该系统包含图像和噪声特性测试子系统以及光谱响应测试子系统。本文首先介绍了低照度CMOS图像传感器国内外发展与研究现状,阐述了 CMOS图像测试技术的研究现状,同时研究CMOS图像传感器工作原理和低照度CMOS的定义及影响因素;然后根据低照度CMOS图像传感器的测试需求及性能评价方法,设计了低照度CMOS综合性能测试系统。其中,图像和噪声特性测试子系统所设计的大动态范围积分球均匀光源系统能保证获得在10-7～104lx范围内输出稳定的面均匀光源,光谱响应测试子系统选取激光泵浦宽带光源来实现宽光谱测试,同时选取双级联单色仪来提高出射光的单色性;接着根据低照度CMOS图像传感器性能参数的测试要求,搭建了图像和噪声特性测试子系统,并在已有的光谱响应测试子系统硬件平台上,分别对自主研制的光功率计和照度计进行校准,编写测试软件,完成测试系统软、硬件联调;最后验证了光源系统的均匀性及稳定性,在此基础上开展低照度CMOS图像传感器综合性能测试实验,得到不同曝光时间下低照度CMOS信噪比、暗电流等参数值以及不同波长下光谱响应及量子效率参数值并绘制对应曲线。测试结果表明,低照度CMOS综合性能测试系统稳定性高,符合测试技术指标。
[Abstract]:Low illuminance CMOS devices are widely used because of their small size and ability to work day and night. The performance parameters such as signal-to-noise ratio gain dynamic range full well charge and spectral response are important characteristics of CMOS imaging devices. In this paper, the comprehensive performance test system of low illuminance CMOS image sensor is developed, which focuses on the comprehensive performance testing technology of low illuminance CMOS image sensor. The system includes image and noise characteristic test subsystem and spectral response test subsystem. This paper first introduces the development and research status of low illuminance CMOS image sensor at home and abroad, expounds the research status of CMOS image testing technology, and studies the working principle of CMOS image sensor, the definition of low illuminance CMOS and its influencing factors. Then, according to the test requirement and performance evaluation method of low illuminance CMOS image sensor, a low illuminance CMOS integrated performance test system is designed. Among them, the large dynamic integrated sphere uniform light source system designed by the image and noise characteristic testing subsystem can guarantee the stable surface uniform light source output in the 10-7~104lx range. The spectral response test subsystem selects the laser pumped wide band light source to realize the wide spectrum measurement, and selects the double cascade Monochromator to improve the monochromism of the emitting light. Then according to the requirements of the performance parameters of the low illuminance CMOS image sensor, The image and noise characteristic testing subsystem is set up, and the optical power meter and illumination meter developed by ourselves are calibrated on the hardware platform of the spectrum response test subsystem, and the test software is compiled to complete the software and hardware adjustment of the test system. Finally, the uniformity and stability of the light source system are verified. On this basis, a comprehensive performance test experiment of low illuminance CMOS image sensor is carried out, and the low illuminance CMOS signal-to-noise ratio is obtained under different exposure time. The spectral response and quantum efficiency parameters of dark current and different wavelengths were measured and the corresponding curves were drawn. The test results show that the low illuminance CMOS integrated performance test system has high stability and accords with the technical specifications.
【学位授予单位】：南京理工大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TP212

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