一种抗老化消除浮空点并自锁存的老化预测传感器
发布时间：2018-11-21 19:33
【摘要】：随着集成电路芯片制造工艺进入纳米阶段,电路可靠性问题变得越来越严重,以负偏置温度不稳定性效应为代表的电路老化也逐渐成为影响其性能的重要因素。基于老化预测的精确性和传感器功能的多样性,提出了一种抗老化、可编程的老化预测传感器。其中稳定性检测器部分利用反馈回路解决了浮空点问题,同时整合了锁存器部分,实现了对老化预测结果的自动锁存,从而增加了老化预测的精确度,减小了一定的面积开销。最后通过HSPICE模拟器仿真验证了该传感器的优越性,且与经典结构相比降低了约21.43%的面积开销。
[Abstract]:With the development of IC chip manufacturing process, the problem of circuit reliability becomes more and more serious, and the aging of the circuit, represented by the negative bias temperature instability, is becoming an important factor affecting the performance of IC chip. Based on the accuracy of aging prediction and the diversity of sensor functions, a kind of anti-aging and programmable aging prediction sensor is proposed. The stability detector uses the feedback loop to solve the floating point problem, and integrates the latch part to realize the automatic latch of the aging prediction results, thus increasing the accuracy of the aging prediction and reducing the area overhead. Finally, the superiority of the sensor is verified by the simulation of HSPICE simulator, and the area overhead is reduced by 21.43% compared with the classical structure.
【作者单位】： 安徽理工大学计算机科学与工程学院;安徽理工大学电气与信息工程学院;合肥工业大学;
【基金】：国家自然科学基金资助项目(61404001,61306046);国家自然科学基金面上项目(61371025) 安徽省高校省级自然科学研究重大项目(KJ20148D12) 淮南市科技计划(2013A4011)
【分类号】：TP212
本文编号：2348066
[Abstract]:With the development of IC chip manufacturing process, the problem of circuit reliability becomes more and more serious, and the aging of the circuit, represented by the negative bias temperature instability, is becoming an important factor affecting the performance of IC chip. Based on the accuracy of aging prediction and the diversity of sensor functions, a kind of anti-aging and programmable aging prediction sensor is proposed. The stability detector uses the feedback loop to solve the floating point problem, and integrates the latch part to realize the automatic latch of the aging prediction results, thus increasing the accuracy of the aging prediction and reducing the area overhead. Finally, the superiority of the sensor is verified by the simulation of HSPICE simulator, and the area overhead is reduced by 21.43% compared with the classical structure.
【作者单位】： 安徽理工大学计算机科学与工程学院;安徽理工大学电气与信息工程学院;合肥工业大学;
【基金】：国家自然科学基金资助项目(61404001,61306046);国家自然科学基金面上项目(61371025) 安徽省高校省级自然科学研究重大项目(KJ20148D12) 淮南市科技计划(2013A4011)
【分类号】：TP212
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，本文编号：2348066
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