薄膜热电变换器热电转换误差测试系统研制

发布时间：2018-05-26 15:07

本文选题：薄膜热电变换器 + 快速反转法　；参考：《中国计量大学》2016年硕士论文

【摘要】：薄膜热电变换器是计量交流电压及交流电流的参考基准,在电学标准领域具有非常重要的地位。论文研制的热电转换误差测试系统,对评价薄膜热电变换器的热电转换性能具有重要的研究意义。本文首先利用直流快速反转法(FRDC)设计了用于评价薄膜热电变换器热电转换误差的信号源,即FRDC源。FRDC源内部包括7V基准电压电路、分压缓冲电路和模拟开关电路三个部分。基准电压通过分压缓冲电路后被模拟开关切换为FRDC波形和CPDC波形,加载于薄膜热电变换器的加热电阻。最后测量薄膜热电变换器上热电堆的输出电压,计算交直流转换误差。对7V基准电压电路产生的基准电压进行测试的结果表明,其稳定度为0.7ppm/h。其次,由于薄膜热电变换器上热电堆的冷端位于衬底上表面,当环境温度发生变化时,热电堆冷端温度也会随之变化,对测量结果引入较大误差。因此,本文设计了一个基于热电制冷片(TEC)的恒温平台,使薄膜热电变换器的衬底温度保持稳定。经计算,30分钟内衬底温度的最大变化量仅为2.5×10-4℃。最后,制作了一台FRDC源样机,并对薄膜热电变换器的热电转换误差进行测试,对测量误差进行了分析。
[Abstract]:Thin film thermoelectric converter is a reference datum for measuring AC voltage and AC current. It has a very important position in the field of electrical standards. A thermoelectric conversion error testing system developed in this paper has important significance to evaluate the thermoelectric conversion performance of thin film thermoelectric converters. First, the design of FRDC is designed. The signal source used to evaluate the thermoelectric conversion error of the thin film thermoelectric converter, that is, the FRDC source.FRDC source includes the 7V reference voltage circuit, the partial voltage buffer circuit and the analog switching circuit three parts. The reference voltage is switched to the FRDC wave and the CPDC waveform by the analog switch after the voltage division buffer circuit, and is loaded to the heating power of the thin film thermoelectric converter. Finally, the output voltage of the thermoelectric reactor on the thin film thermoelectric converter is measured and the AC / DC conversion error is calculated. The result of the test of the reference voltage produced by the 7V reference voltage circuit shows that the stability is next to 0.7ppm/h., because the cold end of the thermoelectric reactor on the thin film thermoelectric converter is on the surface of the substrate, when the ambient temperature changes, The temperature of the cold end of the thermoelectric reactor will also change and introduce a large error to the measurement results. Therefore, a thermoelectric refrigerator (TEC) based thermostatic platform is designed to keep the substrate temperature of the thin film thermoelectric converter stable. The maximum variation of the substrate temperature in 30 minutes is only 2.5 x 10-4 C. Finally, a FRDC source sample is made. The thermal conversion error of the thin-film thermoelectric converter is tested, and the measurement error is analyzed.
【学位授予单位】：中国计量大学
【学位级别】：硕士
【学位授予年份】：2016
【分类号】：TB97

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