蒙特卡洛方法研究积分球测量发射率的影响因素
发布时间：2018-11-17 17:30
【摘要】：采用理论数值分析和计算机蒙特卡洛光线追迹模拟相结合的方法,研究积分球在设计和操作中影响发射率测量精度的因素,包括积分球开口大小,积分球内壁污损,参考样本与待测样本的发射率,主动光源的功率等。研究结果表明:积分球探测口开口比例对发射率的测量无明显影响,当积分球内壁污损时参考样本和待测样本发射率的值相差很大时测量结果会有偏差,积分球自身辐射使发射率测量值偏高。当参考样本与待测样本发射率相差小于0.1,积分球在污损情况下发射率测量误差小于等于4‰。洁净情况下,入射光源功率大于100 W时,积分球自身辐射对发射率的影响低于5‰。
[Abstract]:By using the method of theoretical numerical analysis and Monte Carlo ray tracing simulation, the factors that affect the accuracy of emissivity measurement in the design and operation of the integrated sphere are studied, including the size of the opening of the integral sphere and the fouling of the inner wall of the integral sphere. The emissivity of the reference sample and the sample to be tested, the power of the active light source, etc. The results show that there is no obvious effect on the emissivity measurement by the ratio of the probe opening to the integral sphere, and when the emissivity of the reference sample and the sample to be measured varies greatly when the inner wall of the integrated sphere is defaced, the measurement result will be deviated. The emissivity measurement value is higher because of the radiation of the integral sphere itself. When the emissivity difference between the reference sample and the sample to be tested is less than 0.1, the emissivity measurement error of the integrated sphere is less than 4 鈥，
本文编号：2338567
[Abstract]:By using the method of theoretical numerical analysis and Monte Carlo ray tracing simulation, the factors that affect the accuracy of emissivity measurement in the design and operation of the integrated sphere are studied, including the size of the opening of the integral sphere and the fouling of the inner wall of the integral sphere. The emissivity of the reference sample and the sample to be tested, the power of the active light source, etc. The results show that there is no obvious effect on the emissivity measurement by the ratio of the probe opening to the integral sphere, and when the emissivity of the reference sample and the sample to be measured varies greatly when the inner wall of the integrated sphere is defaced, the measurement result will be deviated. The emissivity measurement value is higher because of the radiation of the integral sphere itself. When the emissivity difference between the reference sample and the sample to be tested is less than 0.1, the emissivity measurement error of the integrated sphere is less than 4 鈥，
本文编号：2338567
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