环氧基碳纳米管纳米电介质的直流真空沿面闪络特性

发布时间：2018-05-15 17:49

本文选题：碳纳米管 + 环氧树脂　；参考：《高电压技术》2017年09期

【摘要】：气-固界面的沿面闪络电压低于同等条件下同种气体的击穿电压,从而制约着特高压电力设备的发展。对固体绝缘材料进行改性可以提高气-固绝缘系统的沿面闪络性能。为此,制备了8种不同的多壁碳纳米管(MWCNTS)掺杂环氧树脂,即掺杂质量分数分别为0%、0.02%、0.05%、0.1%、0.125%、0.15%、0.2%和0.5%的8种试样,并对试样进行了显微形貌、玻璃化转变温度、介电常数、表面粗糙度、电阻率、表面电位衰减特性(SPD)、直流真空沿面闪络特性的测试。试验结果表明:随着掺杂质量分数的提高,环氧复合材料的沿面闪络电压先上升后下降,并且在掺杂质量分数为0.1%时达到极大值,环氧复合材料的闪络电压比纯环氧树脂的提升了23.1%。通过分析发现,掺杂质量分数较低时,沿面闪络电压的上升与陷阱深度的增加及介电常数的下降有关;而掺杂质量分数较高时,沿面闪络的下降与浅陷阱密度的增加及介电常数上升有关。通过分析得到,介电常数会引起电场畸变,陷阱的深度和密度会影响载流子迁移过程,二者均对沿面闪络电压产生影响。
[Abstract]:The flashover voltage of gas-solid interface is lower than the breakdown voltage of the same gas under the same condition, which restricts the development of UHV power equipment. The surface flashover performance of gas-solid insulation system can be improved by modifying solid insulation material. Eight kinds of multiwalled carbon nanotubes (MWCNTS) doped epoxy resins were prepared, that is, the doped mass fraction was 0 / 0.02 / 0. 05 / 0. 1 / 0.125% and 0. 15% and 0. 5% respectively. The micromorphology, glass transition temperature, dielectric constant, surface roughness of the samples were also studied. Resistivity, surface potential attenuation characteristics, DC vacuum flashover along the surface test. The experimental results show that with the increase of doping mass fraction, the flashover voltage of epoxy composite rises first and then decreases, and reaches the maximum when the doping mass fraction is 0.1. The flashover voltage of epoxy composite is 23.1g higher than that of pure epoxy resin. It is found that the increase of flashover voltage along the surface is related to the increase of trap depth and the decrease of dielectric constant when the doping mass fraction is low, and the increase of the flashover voltage is related to the decrease of dielectric constant when the doping mass fraction is high. The decrease of flashover along the surface is related to the increase of shallow trap density and the rise of dielectric constant. The results show that the dielectric constant will cause electric field distortion, the depth and density of traps will affect the carrier migration process, and both of them will affect the flashover voltage along the plane.
【作者单位】：西安交通大学电力设备电气绝缘国家重点实验室;平高集团有限公司国家电网高压开关设备绝缘材料实验室;中国电力科学研究院;
【基金】：国家自然科学基金(51337008) 国家重点基础研究发展计划(973计划)(2015CB251003) 清华大学电力系统国家重点实验室开放课题(SKLD16KZ04) 中国博士后科学基金(2014M552449) 中央高校基本科研业务费专项资金(xjj2014022) 西安交通大学“新教师支持计划”(DWSQc130000008)~~
【分类号】：TM21

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