LED灯具寿命加速试验方法研究

发布时间：2018-07-21 21:28

【摘要】：随着半导体发光二极管LED技术的迅速发展,LED光源的光效在不断提高,成本不断下降,与普通的白炽灯、荧光灯等相比,LED光源发光效率高,节能性好,寿命长,LED灯具己经大范围在生活中应用。因为LED灯具所具有的长寿命特点使得其测试试验时间较长,因此研究LED灯具的加速寿命试验方法具有十分重要的意义。此外,由于LED在工作过程中将产生大量热量,导致芯片结温升高,严重影响到LED灯具的性能和寿命,因此对LED灯具散热装置进行散热性能研究具有重要的意义。目前,针对LED灯具的寿命试验中,比较常用的是采用单应力进行的加速寿命试验,为了降低试验时间,本论文设计了温度和湿度两个应力条件下的双加速寿命试验方案。同时,采用寿命评估方法对试验所得的数据进行整理推算其寿命。针对LED灯具中散热装置的散热效果研究,本论文采用FLOEFD仿真软件与实际测量相结合的方法,对样品灯具的不同散热装置的散热效果及其对LED结温的影响进行分析。本论文主要的工作内容包括:(1)针对LED灯具寿命试验,设计了以温度应力和湿度应力作为加速应力的加速寿命试验,并以光通量衰减为初始光通量的70%作为失效判据进行检测,有效缩短了试验时间。(2)运用FLOEFD散热仿真软件对样品灯具所采用的散热装置进行散热仿真分析,并与实际测量的数据进行对比验证。(3)对LED灯具加速寿命所得的光通量试验数据,运用以威布尔分布来描述产品的寿命分布,利用最小二乘法和阿伦尼斯模型、Peck模型对所得的试验数据进行统计分析,最终外推得出正常应力水平下产品的寿命。
[Abstract]:With the rapid development of LED technology, the light efficiency of LED light source is increasing and the cost is decreasing. Compared with ordinary incandescent lamp and fluorescent lamp, LED light source has high luminous efficiency and good energy saving. Long-life LED lamps have been widely used in life. Because of the long life characteristic of LED lamps, it is very important to study the accelerated life test method of LED lamps. In addition, because LED will produce a lot of heat in the working process, leading to the rise of chip junction temperature, which seriously affects the performance and life of LED lamps, so it is of great significance to study the heat dissipation performance of LED lamp heat dissipation device. At present, the accelerated life test with single stress is commonly used in the life test of LED lamps. In order to reduce the test time, this paper designs a double accelerated life test scheme under two stress conditions: temperature and humidity. At the same time, the life evaluation method is used to calculate the life of the test data. Aiming at the research of the heat dissipation effect of the heat dissipation device in LED lamps, this paper uses the method of FLOEFD simulation software and the actual measurement to analyze the heat dissipation effect of different heat dissipation devices of the sample lamps and the influence on the LED junction temperature. The main contents of this thesis are as follows: (1) the accelerated life test with temperature stress and humidity stress as accelerated stress is designed for LED lamp life test, and the flux attenuation is 70% of the initial luminous flux as the failure criterion. The test time is shortened effectively. (2) using FLOEFD simulation software to simulate and analyze the heat dissipation device used in the sample lamps, and comparing it with the actual measured data. (3) the luminous flux test data obtained from the accelerated life of LED lamps are compared and verified. The product life distribution is described by Weibull distribution, and the test data are statistically analyzed by using the least square method and the Arrhenis model Peck model. Finally, the life of the product under normal stress level is extrapolated.
【学位授予单位】：厦门理工学院
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TM923.34

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