双界面智能卡芯片模拟前端ESD设计

发布时间：2018-01-30 21:09

本文关键词： 双界面智能卡模拟前端(AFE) 静电放电(ESD) 人体模型(HBM) 设计规则芯片成本　出处：《半导体技术》2017年04期 　论文类型：期刊论文

【摘要】：双界面智能卡芯片静电放电(ESD)可靠性的关键是模拟前端(AFE)模块的ESD可靠性设计,如果按照代工厂发布的ESD设计规则设计,AFE模块的版图面积将非常大。针对双界面智能卡芯片AFE电路结构特点和失效机理,设计了一系列ESD测试结构。通过对这些结构的流片和测试分析,研究了器件设计参数和电路设计结构对双界面智能卡芯片ESD性能的影响。定制了适用于双界面智能卡芯片AFE模块设计的ESD设计规则,实现对ESD器件和AFE内核电路敏感结构的面积优化,最终成功缩小了AFE版图面积,降低了芯片加工成本,并且芯片通过了8 000 V人体模型(HBM)ESD测试。
[Abstract]:The key to the reliability of dual interface smart card chip ESD is to design the ESD reliability of the analog front-end (AFE) module, if it is designed according to the ESD design rules issued by the manufacturer. The layout area of AFE module will be very large. A series of ESD test structures are designed according to the characteristics of AFE circuit structure and failure mechanism of dual-interface smart card chip. The effects of device design parameters and circuit design structure on the ESD performance of dual-interface smart card chip are studied, and the ESD design rules suitable for the design of dual-interface smart card chip AFE module are customized. The area optimization of the sensitive structure of ESD device and AFE core circuit is realized. Finally, the area of AFE layout is reduced successfully, and the chip processing cost is reduced. And the chip passed the 8 000 V mannequin HBMU ESD test.
【作者单位】：北京中电华大电子设计有限责任公司射频识别芯片检测技术北京市重点实验室;
【分类号】：TN402
【正文快照】： 0引言双界面智能卡因其可靠性高、防冲突、操作灵活、无源等特点被广泛应用于金融、交通、物流、教育和身份识别等领域[1-2]。双界面智能卡由芯片和感应天线两部分构成,芯片核心是模拟前端(analog front end,AFE)模块,其将天线传递来的电磁波信号转换为芯片内部的电源[3]。AFE

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