材料介电参数准光腔法低温测试技术研究

发布时间：2018-03-06 15:27

本文选题：准光学谐振腔　切入点：复介电常数　出处：《电子科技大学》2017年硕士论文　论文类型：学位论文

【摘要】：随着微波毫米波技术的快速发展,介质材料被广泛应用,对介质材料介电参数的准确测量也变得越来越重要。介质材料的介电参数与频率和温度有着密切的关系,在不同工作频率和工作环境下,材料会呈现出不一样的电磁特性。随着微波设备应用的频率越来越高、应用的环境越来越恶劣,环境温度甚至达到零下几十摄氏度,因此建立一套能够在高频,低温环境下对材料介电参数进行准确测试的测试系统变得越来越重要。首先,文章介绍了国内外关于材料介电参数变温测试技术的进展,并通过比较不同测试方法的优缺点,最终将准光腔法作为本文的测试方法。其次,文章对准光学谐振腔进行理论分析,并通过MATLAB对准光学谐振腔内部的电场和能量分布进行模拟,同时对材料介电参数的测试原理进行了详细介绍。基于理论分析,设计了可以同时工作于3mm、8mm两个频段的准光学谐振腔。利用搭建的系统在真空和非真空状态下对材料进行了测试,并通过数据分析了温度、结霜度对准光腔性能的影响。为了消除这些影响,对准光腔腔体进行结构改进并研制了密封装置和测试夹具,同时为了方便与外部设备连接,设计了与准光腔相匹配的耦合装置。再次,选用冷却液循环制冷作为系统的制冷设备,通过对比不同除湿技术的优缺点,本文选择半导体制冷除湿作为除湿方案,并研制了相应的除湿装置。为了实时测试,研制了加热与温控装置。最后,对各个子系统进行测试,最终搭建可以工作在-50~100℃的准光学谐振腔变温测试系统,确定了测试流程并用VC++编写了测试软件。利用研制的变温测试系统对标准样品进行测试,对测试结果进行了误差分析。测试结果表明本文研制的变温测试系统具有良好的稳定性和实用性,可以对低损耗材料的介电参数进行准确测试。对于高损耗材料,只能在某几个频点上对材料的介电参数进行准确测试。
[Abstract]:With the rapid development of microwave and millimeter wave technology, dielectric materials are widely used, accurate measurement of the dielectric parameters has become more and more important. The dielectric permittivity and frequency and temperature are closely related, in different working frequency and the working environment, the material will exhibit different electromagnetic characteristics with the increasing frequency and microwave equipment application is high, the application environment is more and more bad, the ambient temperature below zero or even tens of degrees Celsius, so the establishment of a high frequency in low temperature environment, the dielectric parameters of material testing system for accurate testing becomes more and more important. Firstly, this paper introduces the advances on dielectric materials the electrical parameters of temperature testing technology at home and abroad, and the advantages and disadvantages of different testing methods, will eventually be quasi optical cavity method as a test method in this paper. Secondly, the alignment of optical resonator Theoretical analysis and field and energy distribution of the optical resonant cavity is simulated by MATLAB and alignment, the test principle of the dielectric parameters of the material are introduced in this paper. Based on the theoretical analysis, the design can work simultaneously in 3mm, quasi optical resonant cavity 8mm two frequency bands. The vacuum and non vacuum condition tested materials using the built system, and analyzes the influence of Frost temperature through the data, the quasi optical cavity properties. In order to eliminate these effects, the quasi optical cavity structure was improved and the development of the sealing device and test fixture, at the same time in order to facilitate the connection with external equipment, design and quasi coupling device matching the optical cavity. Thirdly, selection of cooling liquid cycle cooling system as the refrigeration equipment, through comparing the advantages and disadvantages of different desiccant technology, the semiconductor refrigeration dehumidification thedehumidifying scheme, and development The corresponding dehumidifying device. In order to test in real time, heating and temperature control device is developed. Finally, testing of each subsystem, and ultimately build quasi optical cavity temperature testing system can work at -50~100 DEG C, the testing process and test software written by VC++. Using the temperature test system to test the standard sample, the test results are analyzed. Test results show that the temperature of this testing system has good stability and practicality, can the dielectric parameters of low loss materials for accurate testing. For high loss materials, only in certain frequency on dielectric parameters of materials for accurate testing.

【学位授予单位】：电子科技大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TN04

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