用于半导体激光器电导数测试的嵌入式系统研制

发布时间：2018-05-02 22:50

本文选题：半导体激光器 + 可靠性　；参考：《吉林大学》2017年硕士论文

【摘要】：自二十世纪六十年代半导体激光器研制成功以来,随着半导体激光器的发展,其应用范围越来越广,尤其是在通信、信息存储、医疗、测量、军事等领域的应用使得人们对半导体激光器性能的要求越来越严格。如何准确、高效地测量半导体激光器的特性参数来评价其可靠性已经成为一件重要的任务。本论文围绕半导体激光器电导数测试技术展开研究,旨在研制一台高性能的大功率半导体激光器测试系统。论文首先综述了半导体激光器的发展,对半导体激光器的应用作简要介绍,同时对半导体激光器电导数测试技术的发展进行了简要介绍。针对大功率半导体激光器驱动电流大的特点,本论文提出一种变步长扫描电流驱动下的高功率半导体激光器电导数的测试方法,以实现在采集较少的数据量的条件下能快速、准确的检测出器件的光电特性参数。本文中,首先按照实验方案搭建实验环境,设计并且焊接半导体激光器的驱动与采样电路,实现其端电压和光功率的采集,然后利用现有单片机开发箱的串口将测量数据发送到PC机,对获得的数据在PC机上利用Matlab软件进行处理,包括信号滤波、求导和变步长的算法研究。然后建立数学模型,设计算法。在变步长测试算法研究成功之后,根据选定的测量方法进行测试系统的硬件电路设计,包括单片机控制系统、半导体激光器驱动与检测电路、电源电路等。软件设计部分是在Keil平台下使用C高级编程语言进行设计,在半导体激光器测试程序中,将采集到的电压数据和光功率数据用数值微分的方法得到电导数和光导数的数据,系统将数据绘制曲线,将并将测试曲线和参数显示在LCD屏幕上,同时可以保存至存储卡中,方便在其它平台上分析处理。另外,对这些数据应用最小二乘拟合、线性回归等方法可以准确求得阈值电流Ith、阈前斜率RS1、阈后斜率RS2、阈后截距b、结特征参量m、结电压饱和深度h、光功率曲线斜率效率ES和最大测试光功率P_(max)等参数。本论文所研制出的测试系统,不用连接PC机便可独立完成半导体激光器电导数特性曲线的绘制和电导数参数的测量,我们通过测试结果可以迅速判断出半导体激光器的优劣。由于采用变步长的测试方法,对每只激光器只需要采集150组数据就可以精确的得到相关参数,测试时间不到10秒钟,快速准确,对器件的损伤小,测试效率高。
[Abstract]:Since the successful development of semiconductor lasers in the 1960s, with the development of semiconductor lasers, their applications have become more and more extensive, especially in communications, information storage, medical treatment and measurement. The application of military and other fields makes the performance of semiconductor laser more and more strict. How to accurately and efficiently measure the characteristic parameters of semiconductor laser to evaluate its reliability has become an important task. The purpose of this thesis is to develop a high performance high power semiconductor laser testing system. In this paper, the development of semiconductor lasers is reviewed, and the applications of semiconductor lasers are briefly introduced. At the same time, the development of electrical derivative testing technology of semiconductor lasers is briefly introduced. In view of the large driving current of high power semiconductor laser, this paper presents a method of measuring the conductance of high power semiconductor laser driven by variable step scanning current, which can realize the fast performance under the condition of collecting less data. The photoelectric characteristic parameters of the device are accurately detected. In this paper, firstly, the experimental environment is built according to the experimental scheme, and the driving and sampling circuit of semiconductor laser is designed and welded to realize the acquisition of terminal voltage and optical power. Then the serial port of the existing single-chip microcomputer development box is used to send the measurement data to the PC, and the obtained data is processed by the Matlab software on the PC computer, including the algorithm of signal filtering, derivation and variable step size. Then the mathematical model is established and the algorithm is designed. After the research of the variable step size testing algorithm is successful, the hardware circuit of the test system is designed according to the selected measurement method, including the single-chip microcomputer control system, the semiconductor laser drive and detection circuit, the power supply circuit and so on. In the part of software design, C high-level programming language is used in Keil platform. In the test program of semiconductor laser, the data of electric derivative and optical derivative are obtained by numerical differential method from the collected voltage data and optical power data. The system draws the curve of the data, displays the test curve and parameters on the LCD screen, and at the same time can save the data to the memory card for easy analysis and processing on other platforms. In addition, the least square fitting is applied to these data, The parameters such as threshold current, threshold front slope RS1, back threshold slope RS2, back threshold intercept b, junction characteristic parameter m, saturation depth h of junction voltage, slope efficiency es of optical power curve and maximum measured optical power P max can be obtained by linear regression method. The test system developed in this paper can draw the electric derivative characteristic curve and measure the electric derivative parameters of semiconductor laser without connecting PC. We can quickly judge the advantages and disadvantages of semiconductor laser by the test results. Because of the variable step size measurement method, 150 sets of data can be obtained accurately for each laser. The test time is less than 10 seconds, the testing time is less than 10 seconds, the speed is accurate, the damage to the device is small, and the testing efficiency is high.
【学位授予单位】：吉林大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TN248.4

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