高低温环境材料复介电常数测试技术研究

发布时间：2018-05-20 03:44

  本文选题：复介电常数 + 带状线谐振器　； 参考：《电子科技大学》2015年硕士论文

【摘要】：高频PCB基板在微波电路与天线设计领域使用极其广泛,目前,我国低损耗高频微波PCB基板市场基本被罗杰斯,雅龙等国外公司垄断,为了打破这一现状,国内一些机构正在研究制造国产低损耗高频PCB基板。衡量高频PCB基板性能的一个重要指标是其在变温情况下复介电常数的温度系数,即随温度的变化。本文的主要工作即是基于带状线谐振器法为衡量低损耗高频PCB基板性能提供一套变温复介电常数测试系统。本文首先阐明了带状线谐振器法的基本理论,并在HFSS软件中验证了影响低损耗材料带状线谐振器品质因数的一个关键参数:金属表面电阻,以及一些其他参数,包括空气耦合间隙,金属表面粗糙度,探针尺寸,封闭腔体杂模等对谐振器频率响应的影响。基于以上理论与仿真分析,针对低损耗高频PCB基板的介质损耗测试问题,提出了利用平行板介质谐振器法对带状线谐振器金属材料进行变温条件下的微波表面电阻测试,并基于变温测试数据对测得的复介电常数重新修正的新方案。然后,采用低温冷却液循环制冷与电加热方式分别组建了变温条件下的微波复介电常数与金属微波表面电阻测试系统,对包括Rogers 6006,聚四氟乙烯等低损耗高频PCB基板进行了变温条件(-50℃-120℃),宽带范围(1-18GHz)内的复介电常数测试,通过修正金属材料的表面电阻,对变温条件下的介质损耗数据进行了误差修正,最终测试结果与罗杰斯公司提供的参考数据比对呈现了较好的一致性。
[Abstract]:High frequency PCB substrate is widely used in the field of microwave circuit and antenna design. At present, the market of low loss high frequency microwave PCB substrate is monopolized by Rogers, Yalong and other foreign companies. Some domestic institutions are studying and manufacturing domestic low-loss high-frequency PCB substrates. An important index to evaluate the performance of high frequency PCB substrate is the temperature coefficient of the complex dielectric constant, that is, the change of the complex permittivity with temperature. The main work of this paper is to provide a variable temperature complex dielectric constant measuring system for low loss high frequency PCB substrate based on the strip line resonator method. In this paper, the basic theory of the strip line resonator method is first expounded, and a key parameter affecting the quality factor of the strip line resonator with low loss material is verified in HFSS software: metal surface resistance, and some other parameters. The effects of air coupling gap, metal surface roughness, probe size and impurity modes on the frequency response of the resonator are discussed. Based on the above theory and simulation analysis, aiming at the problem of dielectric loss measurement of low loss high frequency PCB substrate, a method of parallel plate dielectric resonator is proposed to measure microwave surface resistance of strip wire resonator metal material at variable temperature. Based on the measured data, the complex dielectric constant is revised. Then, the microwave complex dielectric constant and the metal microwave surface resistance measurement system under the condition of variable temperature were constructed by using the low temperature coolant cycle refrigeration and electric heating method, respectively. The complex permittivity of low loss high frequency PCB substrates, including Rogers 6006 and PTFE, was measured in the range of 1 ~ 18 GHz under varying temperature conditions (-50 鈩，

本文编号：1913081