基于故障插入的电路抗老化输入矢量生成研究
发布时间：2018-07-20 15:04
【摘要】：随着CMOS工艺特征尺寸的不断缩小,晶体管的老化效应严重影响了电路的可靠性,负偏置温度不稳定性(NBTI)是造成晶体管老化的主要因素之一。提出了一种基于固定故障插入的电路抗老化输入矢量生成方法,在电路的合适位置插入固定故障,通过自动测试向量生成(ATPG)工具获取较小的备选抗老化矢量集合,再从中筛选出最优矢量。由该方法生成的输入矢量可以使电路在待机模式下处于最大老化恢复状态,同时具有较小的时间开销。在ISCAS85电路中的仿真结果表明,与随机矢量生成方法相比,在电路待机模式下加载本文方法生成的输入矢量,可以达到最高17%的电路老化时延改善率。
[Abstract]:With the decreasing of CMOS process characteristic size, the aging effect of transistors seriously affects the reliability of the circuits. The negative bias temperature instability (NBTI) is one of the main factors causing the aging of transistors. In this paper, a method for generating anti-aging input vector of circuit based on fixed fault insertion is proposed. The fixed fault is inserted in the proper position of the circuit, and a small set of alternative anti-aging vectors is obtained by automatic test vector generation (ATPG) tool. The optimal vector is selected from it. The input vector generated by this method can make the circuit in the state of maximum aging recovery in standby mode, and it also has less time cost. The simulation results in the ISCAS85 circuit show that compared with the random vector generation method, the input vector generated by the proposed method can achieve a maximum improvement rate of 17% in the circuit aging delay compared with the random vector generation method in the standby mode of the circuit.
【作者单位】： 合肥工业大学电子科学与应用物理学院;
【基金】：国家自然科学基金面上项目(61371025,61274036,61404001)
【分类号】：TN32
，
本文编号：2133915
[Abstract]:With the decreasing of CMOS process characteristic size, the aging effect of transistors seriously affects the reliability of the circuits. The negative bias temperature instability (NBTI) is one of the main factors causing the aging of transistors. In this paper, a method for generating anti-aging input vector of circuit based on fixed fault insertion is proposed. The fixed fault is inserted in the proper position of the circuit, and a small set of alternative anti-aging vectors is obtained by automatic test vector generation (ATPG) tool. The optimal vector is selected from it. The input vector generated by this method can make the circuit in the state of maximum aging recovery in standby mode, and it also has less time cost. The simulation results in the ISCAS85 circuit show that compared with the random vector generation method, the input vector generated by the proposed method can achieve a maximum improvement rate of 17% in the circuit aging delay compared with the random vector generation method in the standby mode of the circuit.
【作者单位】： 合肥工业大学电子科学与应用物理学院;
【基金】：国家自然科学基金面上项目(61371025,61274036,61404001)
【分类号】：TN32
，
本文编号：2133915
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