基于过零检测技术的Pipelined ADC研究
[Abstract]:Digitization is a topic frequently mentioned nowadays. The progress of technology makes the integration of digital system more and more high and the speed of data processing faster and faster. Great performance advantage makes many analog signal processing work replaced by digital technology. However, the signals produced by nature, such as sound, light, temperature, pressure and so on, are changed in a simulated way. As the interface between analog domain and digital domain, A / D converter is still irreplaceable, but the speed of ADC is greatly improved. At the same time, the popularity of portable devices and smart devices makes the industry pay more attention to the low power design of the system. In this context, universities and companies at home and abroad have proposed many high-speed low-power A-D converter structures. The pipelined A / D converter based on zero crossing detection technology not only retains the advantages of high speed and high precision in the system architecture, but also has the advantages of high speed and high precision. Moreover, the low power zero crossing detector and controlled current source are used to replace the high power operational amplifier in the single stage circuit, which greatly reduces the power consumption of the system. Because there is no feedback loop, the problem of system stability is solved, the design is simplified, and the influence of process change on the system is alleviated. In this paper, a pipelined analog-to-digital converter based on zero-crossing detection technology is designed based on 55nm CMOS technology, which has a power supply voltage of 2.5 V, a resolution of 10 bits and a sampling rate of 50 MSPS. The whole system consists of 10 stages, of which one stage sampling and holding module is 8 stage 1.5 bit sub A / D converter and 1 stage 2 bit parallel A / D converter. In order to improve the dynamic range and linearity, the system adopts a fully differential structure. The function of zero-crossing detection mainly depends on a five-transistor operational amplifier, and the delay adjustment unit is added to the zero-crossing detector to correct the delay caused by the process and temperature. An improved common gate current mirror is used to reduce the charge injection at the output end when the current mirror is turned off. Using the improved zero-crossing detector as the comparator of the parallel analog-to-digital converter, the quantization and coding of the input signal can be completed in the sampling phase, and the residual amplification time of the MDAC in the holding phase is increased. Using the combination of misalignment error foreground correction and offset error background correction to correct the system non-ideal factor and introducing the offset error can effectively reduce the static energy in the output dynamic performance of the analog-to-digital converter. Under the simulation condition that the sampling frequency is 50m SPS and the input signal is 16.89 MHz chord wave signal, the performance of A / D conversion system is about 59 dB, the non-spurious dynamic range is about 67 dB, and the effective bit number is about 9.5 bits. The core power consumption of ADC is about 27.5 MW.
【学位授予单位】:电子科技大学
【学位级别】:硕士
【学位授予年份】:2016
【分类号】:TN792
【相似文献】
相关期刊论文 前10条
1 高永华,王文新,何明中;一种实用的交流电全波过零检测电路[J];电子与自动化;1996年05期
2 徐照胜;廖忠明;;改进的高阶过零检测算法及其在检测中的应用[J];现代商贸工业;2011年23期
3 孔辉;叶菲;王杰贵;;一种改进的过零检测分析方法[J];航天电子对抗;2007年04期
4 陈韶华;相敬林;刘科满;石杰;;水中运动声源的过零检测技术分析[J];系统仿真学报;2007年13期
5 朱俊炎,彭立鑫;一种新型谱分析仪的设计[J];南昌大学学报(理科版);1988年02期
6 朱连成;王仲初;;无锁相环电压全周期过零检测电路的仿真与设计[J];现代电子技术;2007年09期
7 刘镇清;用于应力测试的超声波声速仪[J];测控技术;1993年03期
8 刘俊俊;廖小松;袁嫣红;;提高过零检测精度的方法研究[J];工业控制计算机;2009年10期
9 刘玉强;戴新迪;;过零检测可控硅调功电路的设计[J];黑龙江科技信息;2003年05期
10 刘静章;王进旗;王凤波;;过零检测技术在相位测量中应用[J];电子测量技术;2004年05期
相关会议论文 前4条
1 任利兵;尉昊峗;李岩;;“软”过零检测在红外光谱测量系统中的应用研究[A];中国光学学会2010年光学大会论文集[C];2010年
2 张海波;逯帅;赵广;刘秀成;王赞基;;无冲击的晶闸管投切电容器[A];全国电工理论与新技术学术年会(CTEE'2001)论文集[C];2001年
3 胡\,
本文编号:2198788
本文链接:https://www.wllwen.com/kejilunwen/dianzigongchenglunwen/2198788.html