射频芯片高低温自动测试平台的实现
发布时间：2019-03-19 18:58
【摘要】：随着电子芯片产业的迅猛发展,芯片质量的优劣直接影响到了产品性能的好坏。因而对芯片进行自动化测试的研究已经非常必要。NRF24L01是一款常用的频率在2.45GHz左右能进行无线收发的芯片,本文设计了一套针对该芯片的自动化测试平台。论文首先介绍了测试平台的意义和本文结构安排,然后介绍了为芯片检测提供外部温度环境的仪器——高低温试验箱,以及NRF24L01射频芯片的工作模式和本文利用测试平台要控制的发射模式,给出了自动化测试平台的整体设计框架。接着,论文讲述了虚拟仪器的概念、虚拟仪器体系结构、控制指令和总线技术等,基于这些原理实现了该测量系统中对频谱仪的控制。首先为上位机界面的实现,基于数据库访问技术和VISA函数的应用,设计了一款界面,该界面可以实现初始化频谱仪、自动控制测试平台和自动管理测试数据等。然后为下位机平台的实现,通过串口通信方式实现基于STM32F103芯片的测试平台对NRF24L01射频芯片的工作模式的设置,完成了上位机对射频芯片的控制。测试平台实现了测试系统的常规功能：如对测试平台的控制,数据自动化存储,频谱仪的控制,波形显示等。最后对本文设计的自动化测试平台进行了应用测试,并基于最小二乘法,分析了温度对输出功率的影响,为使用者提供参考。测试结果表明：该测试平台界面友好,操作方便,该测试平台的设计成功,大大缩小了芯片测试的周期,提高了测试的效率,具有较好的可靠性。
[Abstract]:With the rapid development of the electronic chip industry, the quality of the chip directly affects the performance of the product. NRF24L01 is a commonly used chip which can transmit and receive wireless at 2.45GHz or so. In this paper, a set of automatic test platform for the chip is designed. This paper first introduces the significance of the test platform and the structure arrangement of this paper, and then introduces the high and low temperature test chamber, which provides the external temperature environment for the chip detection. As well as the working mode of NRF24L01 RF chip and the transmission mode to be controlled by the test platform, the overall design framework of the automated test platform is presented. Then, the paper describes the concept of virtual instrument, virtual instrument architecture, control instructions and bus technology. Based on these principles, the control of spectrum spectrometer in the measurement system is realized. Firstly, based on the database access technology and the application of VISA function, an interface is designed for the realization of upper computer interface. The interface can realize initialization spectrum spectrometer, automatic control test platform and automatic management of test data, etc. Then, for the realization of the lower computer platform, the test platform based on STM32F103 chip sets the working mode of the NRF24L01 RF chip through serial communication, and completes the control of the RF chip by the upper computer. The test platform realizes the general functions of the test system, such as the control of the test platform, the automatic storage of the data, the control of the spectrum spectrometer, the display of the waveform, and so on. Finally, the automatic test platform designed in this paper is tested, and based on the least square method, the influence of temperature on output power is analyzed, which provides a reference for users. The test results show that the test platform has friendly interface and convenient operation. The design of the test platform is successful, which greatly reduces the cycle of the chip test, improves the efficiency of the test, and has a good reliability.
【学位授予单位】：苏州大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN407
本文编号：2443800
[Abstract]:With the rapid development of the electronic chip industry, the quality of the chip directly affects the performance of the product. NRF24L01 is a commonly used chip which can transmit and receive wireless at 2.45GHz or so. In this paper, a set of automatic test platform for the chip is designed. This paper first introduces the significance of the test platform and the structure arrangement of this paper, and then introduces the high and low temperature test chamber, which provides the external temperature environment for the chip detection. As well as the working mode of NRF24L01 RF chip and the transmission mode to be controlled by the test platform, the overall design framework of the automated test platform is presented. Then, the paper describes the concept of virtual instrument, virtual instrument architecture, control instructions and bus technology. Based on these principles, the control of spectrum spectrometer in the measurement system is realized. Firstly, based on the database access technology and the application of VISA function, an interface is designed for the realization of upper computer interface. The interface can realize initialization spectrum spectrometer, automatic control test platform and automatic management of test data, etc. Then, for the realization of the lower computer platform, the test platform based on STM32F103 chip sets the working mode of the NRF24L01 RF chip through serial communication, and completes the control of the RF chip by the upper computer. The test platform realizes the general functions of the test system, such as the control of the test platform, the automatic storage of the data, the control of the spectrum spectrometer, the display of the waveform, and so on. Finally, the automatic test platform designed in this paper is tested, and based on the least square method, the influence of temperature on output power is analyzed, which provides a reference for users. The test results show that the test platform has friendly interface and convenient operation. The design of the test platform is successful, which greatly reduces the cycle of the chip test, improves the efficiency of the test, and has a good reliability.
【学位授予单位】：苏州大学
【学位级别】：硕士
【学位授予年份】：2015
【分类号】：TN407
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