高频熔融-X射线荧光光谱法测定拟薄水铝石中多种微量和痕量杂质成分

发布时间：2018-03-02 05:38

  本文关键词： 高频熔样 X射线荧光光谱法 拟薄水铝石 微量 痕量 杂质　出处：《湿法冶金》2017年04期 　论文类型：期刊论文

【摘要】：研究了采用高频熔融-X射线荧光光谱法测定拟薄水铝石中SiO_2、Fe_2O_3、Na_2O、K_2O、CaO、ZnO、TiO_2、V_2O_5、P_2O_5等微量和痕量杂质含量。样品以四硼酸锂-偏硼酸锂混合熔剂熔融,以溴化锂为脱模剂,分别在800℃和1 000℃下加热3min,之后在1 150℃下熔融8min,冷却后制成玻璃片,进行测定。用与拟薄水铝石基体及杂质含量相近的氧化铝和氢氧化铝国家标准物质绘制校准曲线,在相同条件下熔融成玻璃片测定各成分荧光强度。当杂质质量分数大于0.001%时,本法测定值与ICP-AES法和AAS法测定值相近,9种杂质成分检出限在0.000 084%~0.005 6%之间,不同成分测定值的相对标准偏差(n=10)在0.36%~8.3%之间。
[Abstract]:The determination of trace and trace impurity contents in pseudo-boehmite by high-frequency melting X-ray fluorescence spectrometry, such as SiO2Fe2O3, Na2OTiK2OK2OK2OK, CaO2O2TiOTiO2V2O5P2O5, and so on, was studied. The samples were melted with lithium tetraboride and lithium metaborate, and lithium bromide was used as the release agent. They were heated at 800 鈩，

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