NOR型FLASH存储器测试技术

发布时间：2018-05-04 12:19

本文选题：NOR型FLASH + DSIO　；参考：《电子与封装》2016年03期

【摘要】：NOR型FLASH存储器因其能够长久地保持数据的非易失性(Non-Volatile)特点,被广泛用作各类便携型数字设备的存储介质,但由于此类器件的编程及擦写均需写入特定指令,以启动内置编程/擦除算法,从而使得采用自动测试系统对其进行测试也具有较高难度。因此,研究NOR型FLASH存储器的测试技术,并开发此类器件的测试平台具有十分重要的意义。首先以AMD公司的AM29LV160DT为例,介绍了NOR型FLASH存储器的基本工作原理,接着详细阐述了一种采用J750EX系统的DSIO模块动态生成测试矢量的方法,从而能够更为简便、高效地对NOR型FLASH存储器的功能进行评价。
[Abstract]:The NOR type FLASH memory is widely used as a storage medium for various portable digital devices because it can keep the data for a long time. However, the programming and erasing of these devices are required to write specific instructions. In order to start the built-in programming / erasure algorithm, it is difficult to use automatic test system to test it. Therefore, it is of great significance to study the testing technology of NOR type FLASH memory and to develop the test platform of this kind of device. Taking AM29LV160DT of AMD Company as an example, this paper introduces the basic working principle of NOR type FLASH memory, and then describes a method of dynamically generating test vector using DSIO module of J750EX system, which can be more convenient. The function of NOR type FLASH memory is evaluated efficiently.
【作者单位】：中国电子科技集团公司第58研究所;
【分类号】：TP333

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