片上存储器可调测试设计的研究与实现

发布时间：2018-06-22 22:34

本文选题：可测性设计 + 可调试性设计　；参考：《国防科学技术大学》2012年硕士论文

【摘要】：随着集成电路尺寸的日益减小和复杂程度的逐步提高，调测试已经成为芯片设计迫切需要解决的问题。嵌入式存储器在SoC中所占比例逐渐增大，为有效检测嵌入式存储器中的缺陷和故障，必须设计一种高质量的嵌入式存储器测试方法，从而能够改善整体成品率并实质性节省测试和制造成本。与此同时，由于传统的存储器测试不能定位并观察故障，必须设计高效的调试手段，才能更好地调试设计中的错误，从而达到修正功能设计错误的目的。本文主要有三个方面的贡献：一是提出一种March YY算法。该算法以业内应用广泛的March算法研究为背景，以各种单一单元故障类型和耦合故障类型的研究为前提，根据每种故障发生时的状态转换图提出解决故障所需的March元素，并根据总结出的March元素在March C+算法的基础上进行优化合并。March YY算法继承了March C+算法六步对称结构的优点，在合理的算法复杂度开销的前提下增加了对WDF、CFdsxwx、CFwd三种故障的覆盖率。二是设计并实现基于MarchYY算法的存储器内建自测试（Memory Built In Self Test，简称MBIST）控制器。本文设计了基于MarchYY算法的MBIST电路，并通过软件模拟验证了March YY算法的全部功能。三是设计并实现基于MBIST控制器的宏测试（Macro Test，简称MT）结构。本文开创性地利用MBIST电路原有的读写逻辑，实现了基于MBIST控制器的MT功能。实践证明，本文设计的March YY算法完全覆盖了目前所有已知的简单故障类型，具有良好的工程应用前景；基于该算法的MBIST电路设计功能正确，具有很好的理论参考价值；基于MBIST控制器的宏测试结构在有效减少电路开销的同时实现了对存储器的宏测试功能，，具有较高的实际应用价值。
[Abstract]:With the gradual decrease of the size of IC and the gradual increase of its complexity, modulation testing has become an urgent problem to be solved in chip design.
The proportion of embedded memory in SoC is increasing. In order to detect the defects and faults in embedded memory effectively, it is necessary to design a high quality embedded memory test method, which can improve the overall yield and save the cost of testing and manufacturing. To observe faults, we must design efficient debugging methods to better debug the errors in the design, so as to achieve the purpose of correcting functional design errors.
The main contributions of this paper are three aspects: first, a March YY algorithm is proposed. The algorithm is based on the research of March algorithm widely used in the industry. Based on the research of the type of single unit fault and the type of coupling fault, the March elements needed to solve the fault are put forward according to the state conversion diagram of each fault. On the basis of the March C+ algorithm, the March element is optimized and merged with the.March YY algorithm to inherit the advantages of the six step symmetric structure of the March C+ algorithm. The coverage rate of the three faults for WDF, CFdsxwx, CFwd is increased under the premise of reasonable algorithm complexity overhead. Two is to design and implement the built-in self-test of the memory based on MarchYY algorithm. Test (Memory Built In Self Test, abbreviated as MBIST) controller. This paper designs MBIST circuit based on MarchYY algorithm, and verifies all functions of March YY algorithm through software simulation. Three, design and implement macro test based on MBIST controller. The MT function based on the MBIST controller is realized.
The practice shows that the March YY algorithm designed in this paper completely covers all the known simple fault types and has good engineering application prospect. The MBIST circuit based on this algorithm has the right function and has good theoretical reference value. The macro test structure based on the MBIST controller can effectively reduce the circuit overhead. The macro test function of memory has high practical application value.
【学位授予单位】：国防科学技术大学
【学位级别】：硕士
【学位授予年份】：2012
【分类号】：TP333

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