弹载存储设备在侵彻下的失效分析

发布时间：2018-09-06 08:04

【摘要】：为了研究弹载存储设备的失效模式,首先对弹载存储设备结构进行分析,并对其进行倾彻模拟分析,得出冲击会使测试仪电路腔发生严重形变、测试仪电路受到挤压甚至破碎。其次对其外壳进行了冲击仿真,得出弹载存储设备壳体高冲击环境下的损伤主要是存储设备的外壳因塑性变形引起的分层。最后针对该弹载记录仪进行侵彻试验,由此得出该弹载存储设备在该环境下的薄弱环节,该结果为提高弹载存储设备的可靠性分析提供依据。
[Abstract]:In order to study the failure mode of the projectile storage device, the structure of the projectile storage device is analyzed firstly, and the emulation analysis of the projectile storage device is carried out. It is concluded that the impact will cause the serious deformation of the circuit cavity of the tester, and the circuit of the tester will be extruded or even broken. Secondly, the impact simulation of the shell is carried out, and it is concluded that the damage of the shell under the high impact environment is mainly caused by plastic deformation of the shell of the storage device. Finally, the penetration test of the projectile recorder is carried out, and the weak link of the projectile storage device in this environment is obtained. The results provide a basis for improving the reliability analysis of the projectile storage device.
【作者单位】： 中北大学仪器科学与动态测试教育部重点实验室;电子测试技术国家重点实验室中北大学;北京青云航空仪表有限公司;
【基金】：国家自然科学基金(51075374) 山西省回国留学人员科研资助项目(2013-077)资助
【分类号】：TJ06;TP333

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