一种片上可测试FLASH存储器的设计
发布时间：2018-10-09 17:49
【摘要】：介绍了一种片上FLASH存储器的设计与实现。通过对FLASH IP接口功能及时序的分析,实现了特定FLASH的控制逻辑;对FLASH增加了片外测试接口,便于片外测试。仿真结果表明,该设计可实现对FLASH的操作与片外测试功能。
[Abstract]:This paper introduces the design and implementation of a kind of on-chip FLASH memory. Through the analysis of the function and timing of FLASH IP interface, the control logic of specific FLASH is realized, and the off-chip test interface is added to FLASH to facilitate the off-chip test. The simulation results show that the design can realize the function of FLASH operation and out-of-chip testing.
【作者单位】： 江南大学物联网工程学院;中国电子科技集团公司第五十八研究所;
【分类号】：TP333
[Abstract]:This paper introduces the design and implementation of a kind of on-chip FLASH memory. Through the analysis of the function and timing of FLASH IP interface, the control logic of specific FLASH is realized, and the off-chip test interface is added to FLASH to facilitate the off-chip test. The simulation results show that the design can realize the function of FLASH operation and out-of-chip testing.
【作者单位】： 江南大学物联网工程学院;中国电子科技集团公司第五十八研究所;
【分类号】：TP333
【参考文献】
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