AMD-APU的内存控制器的测试技术研究和改进

发布时间：2019-05-18 07:15

【摘要】：作为电脑的重要组成部件，内存的进化和发展一直影响着电脑的运算速度和整体性能，虽然市场上最快内存DDR3的最高数据传输速率已经可以达到2133MT/s，但是配置最快的DDR3并不能够保证最高的运算速度，因为系统性能会被另外一个重要参数“内存延迟”影响。内存延迟是指外置内存管理器必须通过北桥进行内存与处理器之间的数据传输从而带来的传输延迟。为了可以充分发挥内存的高速数据传输能力AMD从K8系列CPU（包括Socket754/939/940等接口的各种处理器）内部开始整合了内存控制器，就可以有效控制内存控制器工作在与处理器核心同样的频率上，而且由于内存与处理器之间的数据传输无需经过北桥，可以有效降低传输延迟，这个内置内存管理器简称为DDR。作为AMD最新的APU产品，市场匹配最高速的内存，为了满足客户的高性能要求，DDR的质量是极为重要部分。 APU是AMD最新主推的集成中央处理器CPU和显卡GPU的芯片，其内部的内存控制器功能比K8系列产品更加强劲，，可以支持市面上最快的DDR内存。AMD苏州作为最重要的测试站点致力于有效迅速地判断产品优劣，在保证客户质量的同时有效控制生产成本。测试的内容包括了已有的大多数基础测试，重点是如何确定适合APU的测试条件，然后才可以开始大批量测试。测试条件的选定决定了AMD的测试结果和客户拿到的产品质量，也决定了测试结果能否正确反映出前端生产的问题。选定测试条件需要进行产品特性描述，是半导体测试推出中重要的部分，本文会着重介绍基于APU的特性描述的过程，包括制定计划、实施过程、数据分析和最终决定。产品特性描述的重要性在于选择的测试条件使得测试的误差最小，但是测试硬件的差异性，产品本身特性的波动和测试软件的程序缺陷还是会造成测试的误差。这个误差的表现通常体现在测试不良率上。及时发现测试不良率的变化然后做出改进是AMD产品稳定测试和顺利提供给客户产品的保证。本文会介绍几种不同类型的案例，从问题发现、分析和解决的角度介绍测试内容的改进过程。与研究或设计遇到的问题解决方式不同，整个过程不光着重于技术层面的研究，更重要的是基于大批量测试的分析手法和改进方案。综上所述，本文介绍了基于AMD APU内存控制器的测试发布和改进的整个过程，包括测试内容的制定和发布，产品特性描述和基于大批量测试结果的改进。
[Abstract]:As an important component of the computer, the evolution and development of memory has been affecting the computing speed and overall performance of the computer, although the highest data transmission rate of the fastest memory DDR3 on the market has reached 2133 MTS. However, the fastest configuration of DDR3 does not guarantee the highest computing speed, because system performance will be affected by another important parameter, "memory delay". Memory delay refers to the transmission delay caused by the data transmission between memory and processor that the external memory manager must carry out through the north bridge. In order to give full play to the high-speed data transmission capability of memory AMD began to integrate memory controllers from within the K8 series CPU (including various processors of interfaces such as Socket754/939/940). It can effectively control the memory controller to work at the same frequency as the processor core, and because the data transmission between memory and processor does not need to pass through the North Bridge, it can effectively reduce the transmission delay. This built-in memory manager is referred to as DDR. for short. As the latest APU product of AMD, the market matches the highest speed memory. In order to meet the high performance requirements of customers, the quality of DDR is a very important part. APU is AMD's latest integrated CPU and graphics card GPU chip, and its internal memory controller is more powerful than the K8 family of products. It can support the fastest DDR memory on the market. Amd Suzhou, as the most important test site, is committed to effectively and quickly judging the quality of products and effectively controlling the production cost while ensuring customer quality. The content of the test includes most of the existing basic tests, focusing on how to determine the test conditions suitable for APU before you can start mass testing. The selection of test conditions determines the test results of AMD and the product quality obtained by customers, and also determines whether the test results can correctly reflect the problems of front-end production. The selection of test conditions requires product characteristic description, which is an important part of semiconductor test roll-out. This paper focuses on the process of APU-based feature description, including planning, implementation process, data analysis and final decision. The importance of product characteristic description lies in the fact that the test error is minimized by the selected test conditions, but the difference of test hardware, the fluctuation of product's own characteristics and the program defect of test software will still cause the error of test. The performance of this error is usually reflected in the poor test rate. Timely detection of test failure rate changes and then make improvements is the guarantee of AMD product stability testing and smooth provision to customers. This paper introduces several different types of cases, and introduces the improvement process of test content from the point of view of problem discovery, analysis and solution. Different from the problem solving methods encountered in the research or design, the whole process not only focuses on the technical research, but also on the analysis method and improvement scheme based on mass testing. To sum up, this paper introduces the whole process of test release and improvement based on AMD APU memory controller, including the formulation and release of test content, product feature description and improvement based on mass test results.
【学位授予单位】：苏州大学
【学位级别】：硕士
【学位授予年份】：2013
【分类号】：TP333

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