分立器件测试仪嵌入式软件设计
[Abstract]:Discrete devices are an important industry that embodies the basic scientific and technological strength of the country. With the rapid development and wide application of electronics and other related industries, the importance of discrete device industry is becoming more and more prominent. In the whole industrial chain, testing is a part of the whole industry, and testing plays an extremely important role in the whole discrete device industry. Therefore, it is of great practical significance to study the testing technology and instruments of discrete devices. Embedded technology has been widely used in more and more fields, including electronic testing industry. Combined with embedded technology, the test instrument not only has more and more powerful function, but also has a great improvement in the performance index of the instrument. This paper first introduces the overall architecture of discrete device tester, as well as the software and hardware requirements. According to the requirements of the tester, the S3C2440A chip integrated with ARM920T kernel is selected as the CPU, of the core control board, and the Nor Flash is selected as the memory of the boot program, and the Nand Flash is selected as the memory of the test program and data. In this paper, the memory system and driver design are completed, and according to the characteristics of the starting requirement of the tester, the boot program DDT Boot, is specially designed to complete the driver design of the required interface equipment in the boot program, and to realize the communication with the upper computer. In addition, the design of bus driver function of tester is described in detail. Based on the bus driver function, the design of the bottom function of each function board is completed, and the encapsulation is carried out. This provides a good interface of the underlying function for the writing of the test application, and also increases the generality of the program. The test program can be well completed by using the packaged function. It is of great application value to realize the graphical programming of the test program with the corresponding upper computer software.
【学位授予单位】:电子科技大学
【学位级别】:硕士
【学位授予年份】:2012
【分类号】:TP368.1;TP311.52
【参考文献】
相关期刊论文 前10条
1 胡泽明,岳春生;嵌入式系统开发要素的选择分析[J];单片机与嵌入式系统应用;2003年08期
2 刘锬;Linux嵌入式系统开发平台选型探讨[J];单片机与嵌入式系统应用;2004年07期
3 刘芳;赵振华;;NAND Flash芯片K9F1208在uPSD3234A上的应用[J];单片机与嵌入式系统应用;2007年03期
4 ARIETAL;NAND和NOR flash技术设计师在使用闪存时需要慎重选择[J];今日电子;2002年04期
5 吴平,曹晓琳,李波,王遵立,丁铁夫;基于ARM核的S3C4510B启动代码的研究与应用[J];电子器件;2004年02期
6 张和君;张跃;;基于GNU工具的嵌入式Bootloader设计与开发[J];计算机工程;2006年15期
7 李毅;李连云;张伟宏;张晓先;郑果;李健;;Bootloader面向不同结构Flash的实现[J];计算机工程;2008年04期
8 李娜;李欣;王晶;;基于GPRS传输的车载酒精监测系统的设计[J];数字技术与应用;2010年11期
9 何荣森,何希顺,张跃;从ARM体系看嵌入式处理器的发展[J];微电子学与计算机;2002年05期
10 郑文波,曹金安;嵌入式系统产业化发展——市场、技术与前景[J];自动化博览;2005年01期
相关硕士学位论文 前3条
1 项晨;参照AUTOSAR标准的存储器驱动模块的研究与实现[D];复旦大学;2011年
2 王宇;基于S3C2410的电动机智能保护器Linux平台的研究[D];天津大学;2007年
3 张栋;基于DSP的光纤光栅温度传感系统[D];山东大学;2010年
,本文编号:2487892
本文链接:https://www.wllwen.com/kejilunwen/jisuanjikexuelunwen/2487892.html