Fully coupled electrothermal simulation of resistive random

发布时间：2021-01-06 15:40

　　<正>Dear editor,Resistive random access memory （RRAM） is a promising candidate for next generation memory technology [1] and the rapid progress in the threedimensional （3D） integration technology facilitates the design of highly integrated and miniaturized RRAM devices [2]. However, the ever-growing storage density does lead to thermal crosstalk a 

【文章来源】：Science China（Information Sciences）. 2020,63(08)

【文章页数】：3 页

【参考文献】：
期刊论文
[1]3D resistive RAM cell design for high-density storage class memory—a review[J]. Boris HUDEC,Chung-Wei HSU,I-Ting WANG,Wei-Li LAI,Che-Chia CHANG,Taifang WANG,Karol FRHLICH,Chia-Hua HO,Chen-Hsi LIN,Tuo-Hung HOU.  Science China（Information Sciences）. 2016(06)



本文编号：2960834