基于流形学习的数据降维技术及工程应用研究
[Abstract]:With the rapid breakthrough of artificial intelligence and big data technology, machine learning and data mining, which are the core research fields of artificial intelligence, often get high dimensional, nonlinear data. Taking analog circuit fault diagnosis as an example, especially in a highly integrated circuit board fault location, because of the large number of components and tolerance, the collected data tend to be distributed in high dimension and nonlinear structure. For these large-scale, high-dimensional nonlinear data, people want to intuitively perceive the useful knowledge hidden in high-dimensional data, it is difficult to imagine. Data dimensionality reduction is one of the most effective ways to reduce the dimensionality of high dimensional data. Data dimensionality reduction can be divided into linear reduction and nonlinear dimensionality reduction. Linear dimensionality reduction technology is widely used, but it has poor effect on practical engineering applications containing a large amount of nonlinear data, which makes nonlinear dimensionality reduction technology become a hot research topic at present. In order to obtain the low-dimensional representation of high-dimensional and incomprehensible data, the locally linear embedding dimension reduction method based on manifold learning makes use of the assumptions of local linearity and global nonlinearity to reduce the dimensionality of high-dimensional data. The original structure of high-dimensional data can still be maintained. This characteristic makes it one of the hotspots in the field of machine learning. In this paper, the problem of feature reduction and feature extraction using locally linear embedded (Local Linear embedded LLE technique based on manifold learning method is studied. In order to solve the problem of high characteristic dimension in analog circuit fault diagnosis engineering, a new feature dimension reduction scheme based on wavelet packet decomposition and LLE algorithm is proposed. Fault feature dimension reduction technique based on clonal selection algorithm is studied in this paper. The experimental results verify the applicability of the proposed algorithm in the characteristic dimensionality reduction problem of analog circuit fault diagnosis, which provides a useful reference for the engineering application of LLE algorithm in complex data dimensionality reduction.
【学位授予单位】:北方工业大学
【学位级别】:硕士
【学位授予年份】:2017
【分类号】:TP391.4
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