电子辐照电介质样品带电泄放弛豫特性研究

发布时间：2018-05-14 05:33

本文选题：带电泄放 + 电子辐照　；参考：《物理学报》2017年06期

【摘要】：电子照射电介质材料的带电效应对介质微波部件的微放电现象有着重要影响.本文采用数值模拟的方法研究电子照射介质样品带电后的弛豫泄放过程.对入射电子与样品的相互作用考虑了弹性和非弹性碰撞过程,采用蒙特卡罗方法进行数值模拟;对沉积在样品内部的电荷泄漏过程则采用考虑电荷迁移、扩散以及俘获等过程的时域有限差分法进行处理.模拟了介质样品在带电泄放弛豫过程中的内部电荷和电位分布以及弛豫暂态特性,并分析了包括样品厚度、电子迁移率以及俘获密度在内的样品参数对泄放弛豫过程的影响.计算结果表明:在介质样品带电泄放的弛豫过程中,样品内部的总电荷量和表面电位逐渐减弱到一个与俘获密度直接相关的终态值;迁移率的增大会类线性比例地减少泄放时间常数,电荷泄放量随着样品厚度的增加呈现先增后减的趋势,而泄放量比随俘获密度增大从1近指数关系地减小为零.
[Abstract]:The electrification effect of electron irradiating dielectric material has an important influence on the micro discharge phenomenon of dielectric microwave components. In this paper, the relaxation and discharge process of electron irradiated medium is studied by numerical simulation. The interaction between the incident electron and the sample is taken into account by the elastic and inelastic collision process, and the Monte Carlo method is adopted. Numerical simulation is carried out. The charge leakage process in the sample is treated by the time domain finite difference method considering charge transfer, diffusion and capture. The internal charge and potential distribution and relaxation transient characteristics of the dielectric samples in the discharge relaxation process are simulated, and the thickness of the sample and the electron are analyzed. The effect of the sample parameters, including the mobility and the capture density, on the relaxation relaxation process. The results show that the total charge and surface potential in the sample are gradually weakened to a final state of direct correlation with the capture density during the relaxation of dielectric samples, and the increase in mobility will decrease the discharge linearly. The time constant, the charge discharge volume increases first and then decreases with the increase of the thickness of the sample, while the discharge ratio decreases to zero with the increase of the capture density from the near index of 1.

【作者单位】：中国空间技术研究院西安分院国家级空间微波技术重点实验室;西安交通大学电子物理与器件教育部重点实验室;
【基金】：国家自然科学基金重点项目(批准号:U1537211) 中国博士后科学基金(批准号:2016M602944XB) 空间微波技术重点实验室基金(批准号:9140C530101140C53231,9140C530101150C53011)资助的课题~~
【分类号】：O441.1

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