毫米波天线形面精度摄影测量技术及实践

发布时间：2018-06-27 22:50

  本文选题：毫米波/亚毫米波天线 + 工业摄影测量　； 参考：《微波学报》2017年S1期

【摘要】：天线反射面精度是天线系统主要的技术性能指标,一般要求表面精度是天线工作波长的1/16~1/32,而测量精度要达到表面精度的1/3~1/5。对于毫米波/亚毫米波天线,传统测量方法如经纬仪测量等存在很多缺点,本文提出一种新的测量技术,利用工业摄影测量技术对毫米波/亚毫米波天线形面进行测量,并进行了高精度天线形面测量实践,结果满足要求。
[Abstract]:Antenna reflector accuracy is the main technical performance index of antenna system. Generally, the surface accuracy is 1 / 16 / 32 of the antenna working wavelength, and the measurement accuracy should reach 1 / 3 / 1 / 5 of the surface precision. For millimeter-wave / sub-millimeter-wave antenna, traditional measurement methods such as theodolite measurement have many disadvantages. In this paper, a new measuring technique is proposed to measure the shape of millimeter-wave / sub-millimeter-wave antenna using industrial photogrammetry. The practice of high precision antenna profile measurement is carried out, and the results meet the requirements.
【作者单位】： 郑州辰维科技股份有限公司;华北水利水电大学;
【分类号】：TN822
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本文编号：2075564