空间调制型全偏振成像系统的角度误差优化

发布时间：2018-06-12 01:03

本文选题：偏振 + 偏振成像　；参考：《红外与激光工程》2017年01期

【摘要】：空间调制型全偏振成像系统利用Savart偏光镜能够将被探测目标的4个Stokes参数S0~S3调制在同一幅干涉图像中,从而通过单次采集便可获得完整的偏振信息。在该系统中,半波片和检偏器的角度误差对Stokes参数的测量精度有着不可忽略的影响。文中首先给出了包含上述两种角度误差的干涉强度调制方程,根据实际系统参数,在角度误差模型的基础上分析了当入射光为自然光、0°/90°线偏振光、45°/135°线偏振光和左/右旋圆偏振光时,角度误差对空间调制型全偏振成像系统的Stokes参数测量精度的影响。利用这四种基态偏振光的偏振测量误差,给出了任意偏振态和偏振度的入射光偏振测量误差的表征方法 ,最后,文中以系统测量矩阵条件数为优化目标函数,经仿真计算得出当Savart板厚度为23 mm时系统测量矩阵条件取得最小值为2.06,半波片和检偏器耦合角度误差对系统偏振测量精度的影响程度最小。
[Abstract]:The spatially modulated fully polarized imaging system uses Savart polarizer to modulate the four Stokes parameters S0S3 of the detected target in the same interferometric image, so that the complete polarization information can be obtained by a single acquisition. In this system, the angular error of half-wave plate and polarizer has an important effect on the measurement accuracy of Stokes parameters. In this paper, the interference intensity modulation equation including the above two kinds of angle errors is first given. According to the actual system parameters, Based on the angle error model, the influence of angle error on the measurement accuracy of Stokes parameters of spatially modulated fully polarized imaging system is analyzed when the incident light is a natural light with 0 掳/ 90 掳line polarized light and 45 掳/ 135 掳line polarized light and left / right circular polarized light. Using the polarization measurement error of the four ground state polarized light, the method of describing the polarization measurement error of arbitrary polarization state and polarization degree of incident light is given. Finally, the condition number of the system measurement matrix is taken as the optimized objective function. The simulation results show that when the thickness of Savart plate is 23 mm, the minimum value of measurement matrix condition is 2.06, and the coupling angle error of half-wave plate and polarizer has the least influence on the system polarization measurement accuracy.
【作者单位】：中国科学院安徽光学精密机械研究所;中国科学技术大学;中国科学院通用光学定标与表征技术重点实验室;中国科学院大学;
【基金】：国家703计划(2014AA7031068)
【分类号】：TP751

【参考文献】