百千伏超快电子衍射系统的研发
[Abstract]:In recent ten years, the ultrafast electron diffraction and imaging technology have been developed rapidly. in which the electron pulse energy of the direct current electron gun is developed to several hundred kilovolts from the start of several tens of kilovolts, while the most recent microwave electron gun applied in this field raises the energy to the magnitude of the megavolt; the longitudinal pulse width (time scale) of the electronic pulse is changed from the picosecond magnitude to the femtosecond level, And is even expected to reach the order of a second. On this basis, a variety of time-resolved electronic imaging techniques, including ultrafast scanning electron microscopy and ultrafast transmission electron microscopy, have been developed. The scope of the study also extends from the lattice detection to the surface physics, superconductivity, magnetism, plasma, biology, chemistry and so on, and gradually shows its strong vitality. In this background, we have carried out the R & D and construction of the 100kV ultrafast electron diffraction system. The relevant simulation required by the system design is carried out first, and then a multifunctional compact 100-kilovolt ultrafast electron diffraction system is built, which comprises a 100kV direct current photocathode electron gun, an electronic pulse control device, an ultra-high vacuum chamber and a sample sending and adjusting device, A detection imaging device, a data automatic acquisition system, and an external device, and the like. By simulation we find that the expansion speed in the z-direction (longitudinal direction) will be greatly reduced when the electron pulse passes through the boundary of the electric field, which has a decisive influence on the behavior of the later stage of the electronic pulse. The traditional Mean field model is modified and developed, and a reasonable scheme for describing the internal electron pulse motion of the ultrafast electron diffraction system is given, so that it can accurately describe the movement behavior of the ultrafast electron beam, and is superior to other models. The design of the electron gun greatly avoids the occurrence of local field intensity mutation, so that the electron gun can work stably at a voltage of one hundred kilovolts, the reflection working mode is increased, and the single-shot electron yield is expected to reach the order of millions, so as to realize the detection of the non-reversible process. The special coaxial symmetrical structure ensures the symmetry and stability of the electric field, the good magnetic shielding effect ensures the quality of the electronic pulse, the external protective resistor and the protective cover, and the like, and the safety of the operation of the electron gun is ensured. The complete set adopts a special embedded installation structure design, so that the distance between the cathode of the electron gun and the sample is as short as 130 mm in the case of a magnetic lens, and the shortest length of the magnetic lens can be less than 100 mm. The maximum vacuum degree of the cavity of the device can reach 10-10Torr, and consists of a target chamber, an electron gun chamber, a pump reflector chamber, a Faraday cylinder chamber, an exhaust chamber and the like. The ultra-high vacuum target chamber has a number of windows with a lateral 34 mm diameter flange window special design. The device pump laser reflection mode is specially designed so as to be incident in the opposite direction of the electronic pulse motion. And the later stage of the sample target chamber can be connected with a plurality of other devices to realize the multi-function expansion. The sample feed section has a five-dimensional adjustment range. The sample carrier _ sample rack can ensure the implementation of multiple detection schemes in the future, can be replaced by other devices, and can be upgraded. The detection and imaging system of the device comprises a specially designed Faraday tube, an electronic pulse imaging system, and the like. The data collection system developed by Labview is in the process of R & D. In the time-resolved diffraction (TR-RHEED) of sample surface time-resolved diffraction (TR-RHEED), it was found that the diffraction fringe was split and the distance along with the delay time exhibited a Gaussian distribution. The higher the grade the higher the diffraction fringes, the smaller the splitting pitch. We suspect that the phenomenon is related to the electron emission of the sample, and the peak of the surface electric field after the sample pump is estimated to be on the order of 107 V/ m by the split-pitch approximation. The experiment is expected to obtain sample lattice information and surface electric field information at the same time, and a new time-resolved electron diffraction detection method is provided.
【学位授予单位】:中国科学院大学(中国科学院物理研究所)
【学位级别】:博士
【学位授予年份】:2017
【分类号】:O572.322
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