条带织构装饰技术观察含T─型液晶基元的热致性聚芳酯液晶态的向错

发布时间：2018-03-20 09:20

本文选题：向错　切入点：条带织构　出处：《高分子学报》1996年02期 　论文类型：期刊论文

【摘要】：采用条带织构装饰新技术研究了含Ｔ─型液晶基元的热致性聚芳酯液晶态的向错形态．经过培养的液晶样品无需剪切，淬火后便可呈现出围绕向错点取向排列的条带织构，而条带织构长轴的垂直方向正代表了液晶基元的指向矢方向，这样，在普通偏光显微镜下就能直接观察到这些条带织构装饰的强度Ｓ＝±１／２和Ｓ＝±１的向错，并观察到Ｓ＝－３／２的高强度向错和闭环状的反转壁．
[Abstract]:The dislocation morphology of the thermotropic polyaryl ester liquid crystalline state containing T-type liquid crystal unit was studied by using a new technique of strip texture decoration. After the cultured liquid crystal sample was quenched without shearing, it was found that the strip texture was arranged around the misaligned point. The vertical direction of the long axis of the strip texture represents the direction of the pointing vector of the liquid crystal unit, so that the orientation of the intensity of the ribbon texture decoration S = 卤1/2 and S = 卤1 can be observed directly under the ordinary polarizing microscope. The high intensity misalignment and closed loop reverse wall of Schion-3 / 2 were also observed.
【作者单位】：中国科学院化学研究所北京大学化学系
【基金】：国家基础性研究重大关键项目，高分子凝聚态基本物理问题研究资助
【分类号】：O753.2

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