孤独症谱系障碍儿童表情面孔工作记忆的事件相关电位研究

发布时间：2018-03-29 01:23

本文选题：孤独症谱系障碍　切入点：表情面孔　出处：《中国当代儿科杂志》2017年03期

【摘要】：目的探讨孤独症谱系障碍(ASD)儿童表情面孔工作记忆能力及其事件相关电位(ERP)的特点。方法以中国面孔表情图片系统为测试材料,采用事件相关电位系统分别记录16例6~12岁ASD儿童(ASD组)与14例年龄匹配的正常儿童(对照组)在完成表情面孔延迟样本匹配任务时的脑电成分,分析两组儿童脑电P3b成分的特点。结果 ASD组儿童在表情面孔工作记忆任务中的总体反应时比对照组长(1 527 ms vs 1 060 ms,P0.05)、正确率比对照组低(76%vs 88%,P0.01)。ASD组和对照组间编码加工阶段的P3b成分波幅存在差异。ASD组左侧电极的P3b成分波幅值高于右侧电极波幅(P0.05),而对照组无此特点。结论学龄期ASD儿童在表情面孔编码加工阶段的P3b成分异于正常发育儿童,其表情面孔工作记忆过程可能更多地依赖于左半球相关的神经通路。
[Abstract]:Objective to investigate the characteristics of working memory ability of facial expression and event related potential (ERP) in children with autism spectrum disorder (ASD). Methods the Chinese facial expression image system was used as the test material. Event-related potential system was used to record EEG components of 16 children aged 612 years old and 14 age-matched normal children (control group) when they completed the task of facial expression and facial delay sample matching. Results compared with the control group, the overall response time of the children in the ASD group was higher than that in the control group (1 527 Ms vs 1 060 Ms / P 0.05), and the correct rate was lower than that in the control group. The correct rate was lower than that of the control group (P 0.01) and the coding rate between the two groups was lower than that in the control group. The amplitude of P3b component in the ASD group was higher than that in the right electrode group, but not in the control group. Conclusion the P3b component in the expression coding process of school-age ASD children is different from that of the normal children. The working memory process of facial expression and face may depend more on the left hemisphere related neural pathway.
【作者单位】：中山大学公共卫生学院妇幼卫生系/中山大学公共卫生学院儿童青少年心理行为发育研究中心;
【基金】：国家自然科学基金(81171293)
【分类号】：R749.94

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