基于eMMC的星载大容量存储关键技术研究

发布时间：2018-04-13 13:21

本文选题：eMMC + 星载大容量　；参考：《哈尔滨工业大学》2017年硕士论文

【摘要】：随着空间探测的不断深入以及任务需求的多样化,图像载荷对星载存储器的容量和存储带宽的需求越来越高。星载存储介质经历了磁介质到半导体介质的发展过程,Flash芯片是当前广泛应用的存储介质,但其接口控制和坏块管理复杂,开发成本高、周期长。针对上述问题,本文提出一种采用嵌入式多媒体存储卡(embedded Multi Media Card,eMMC)构建星载大容量存储的方案,并开展关键技术研究,工作如下:首先,通过对国内外星载大容量存储技术的调研,分析了星载存储技术的发展趋势,同时针对星载设备面临的空间辐射环境,对星载容错加固技术进行了调研,重点调研了单粒子翻转效应的容错加固设计和单粒子闩锁效应的防护技术。在分析了eMMC的相关技术特点后,提出了eMMC阵列存储访问控制和基于eMMC星载存储容错加固两项关键技术,并构建了关键技术研究所必需的软硬件系统环境。其次,在开展eMMC阵列存储访问控制技术研究前,对eMMC 5.0规范进行了详细的研究。采用FPGA作为主控制器,对eMMC接口控制逻辑进行了设计和实现,同时,针对上层应用逻辑的读写访问进行eMMC读写调度设计,并针对eMMC阵列中各芯片的延时差异问题,提出了一种eMMC阵列同步技术。再次,针对eMMC器件和控制系统面临的空间辐射环境,本文提出一种面向单粒子翻转效应的eMMC主控制器容错加固技术,提出了基于扩展汉明码的FIFO容错技术和基于三模冗余(Triple Module Redundancy,TMR)技术的状态机容错加固技术;针对单粒子闩锁效应,根据电路发生闩锁故障的特点,提出并进行单粒子闩锁防护电路的设计。最后,针对上述各项关键技术研究,提出了实验测试验证方案,对e MMC访问控制技术采用板级测试方法,对读写功能等进行测试验证;对单粒子翻转效应的容错设计和单粒子闩锁防护电路,主要进行故障注入条件下的测试验证。测试结果显示,各项设计工作符合预期研究目标要求。本文开展的基于eMMC的星载大容量存储关键技术研究,将为后续的实际工程应用提供有效的技术支持储备和设计开发支持。
[Abstract]:With the deepening of space exploration and the diversification of mission requirements, the demand of image payload for space-borne memory capacity and storage bandwidth is increasing.Spaceborne storage medium has experienced the development from magnetic medium to semiconductor medium. Flash chip is a widely used storage medium at present, but its interface control and bad block management are complicated, development cost is high, and cycle is long.In order to solve the above problems, this paper proposes a scheme of using embedded multimedia memory card embedded Multi Media Media MMC to construct spaceborne mass storage, and carries out the research of key technologies. The main work is as follows: first of all,Based on the investigation of space-borne large capacity storage technology at home and abroad, the development trend of space-borne storage technology is analyzed. At the same time, aiming at the space radiation environment faced by space-borne equipment, the space-borne fault-tolerant reinforcement technology is investigated.The fault-tolerant reinforcement design of single particle flip effect and the protection technology of single particle latch effect are investigated.After analyzing the relevant technical characteristics of eMMC, two key technologies, eMMC array memory access control and fault tolerance reinforcement based on eMMC on-board storage, are proposed, and the necessary hardware and software system environment for key technology research is constructed.Secondly, before the research of eMMC array memory access control technology, the specification of eMMC 5.0 is studied in detail.The eMMC interface control logic is designed and implemented by using FPGA as the main controller. At the same time, the eMMC read-write scheduling is designed for the read and write access of the upper application logic, and the delay difference of each chip in the eMMC array is discussed.A eMMC array synchronization technique is proposed.Thirdly, aiming at the radiation environment of eMMC devices and control systems, this paper presents a fault-tolerant reinforcement technique of eMMC master controller for single particle flip effect.In this paper, a fault tolerant technique of FIFO based on extended hamming code and a fault tolerant reinforcement technique of state machine based on triple Module redundancy are proposed.A single particle latch protection circuit is proposed and designed.Finally, in view of the above key technology research, proposed the experimental test verification plan, uses the board-level test method to the e MMC access control technology, carries on the test verification to the reading and writing function and so on;The fault-tolerant design of single particle flip effect and the single particle latch protection circuit are mainly tested and verified under the condition of fault injection.The test results show that the design works meet the requirements of the expected research objectives.The research on the key technology of spaceborne mass storage based on eMMC in this paper will provide effective technical support reserve and design and development support for subsequent practical engineering applications.
【学位授予单位】：哈尔滨工业大学
【学位级别】：硕士
【学位授予年份】：2017
【分类号】：TP333

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