基于STC单片机的半导体材料特性测量仪的设计

发布时间：2018-05-13 21:47

  本文选题：迪文串口液晶屏 + 弱电压放大模块　； 参考：《科学技术与工程》2014年06期

【摘要】：针对冶金行业对半导体材料特性测试的要求,设计了一种基于STC单片机(micro control unit,MCU)和DMT48270T050_01W迪文串口液晶屏的在不同温度下测量半导体材料电阻率和电动势率特性的仪器,该仪器采用ADAM—3014专用弱电压放大模块,最低输入电压范围在0~10 mV,能精确测量设计电路中各阶段待测材料两端电压,同时设计一种阶梯升温的算法,实现了在一次升温过程中在多个温度点保持稳定以满足测试的要求。实验结果表明,采用该设计能够测得精度较高的电阻率和电动势率,并实现了炉温控制精度在±2℃。
[Abstract]:In order to meet the requirements of the metallurgical industry for testing the characteristics of semiconductor materials, an instrument for measuring the resistivity and EMF characteristics of semiconductor materials at different temperatures is designed based on micro control unit MCU (STC single chip microcomputer) and DMT48270T050_01W Devine serial port liquid crystal screen. This instrument uses ADAM-3014 special weak voltage amplifier module, the minimum input voltage range is 0 ~ 10 MV, it can accurately measure the voltage at both ends of the material to be tested in each stage of the design circuit, and at the same time, design a step warming algorithm. In order to meet the requirements of test, the stability at multiple temperature points is realized during one heating process. The experimental results show that the high precision resistivity and EMF can be obtained by this design, and the furnace temperature control accuracy is 卤2 鈩，

本文编号：1884965