高性能北桥芯片中存储器接口的功能验证

发布时间：2018-05-22 16:39

本文选题：北桥芯片 + 存储器接口　；参考：《西安电子科技大学》2012年硕士论文

【摘要】：随着现代计算机系统的高速发展， CPU与内存之间数据交换速率要求越来越高，，CPU与内存之间的速度差异，已经成为制约整个系统性能的瓶颈。使用集成于北桥芯片中的存储器接口，为CPU与内存之间提供数据交换通路，是当前解决这一问题主流方法。本文的研究对象是一款X高性能北桥芯片中存储器接口。论文从验证方法学基础学习出发，介绍了X北桥芯片基本架构，研究了其中存储器接口的相关内容，在充分了解存储器接口相关时序和设计的基础上搭建了验证平台，提取了全面的功能测试点，对其存储器接口的ROM接口，异步DRAM接口，SDARM接口以及检验功能进行了功能验证，并对验证结果进行了分析。验证结果表明，该存储器接口的功能验证方法是可行的，对高性能存储器接口设计和验证工作具有一定的参考价值。
[Abstract]:With the rapid development of modern computer system, the speed difference between CPU and memory is becoming more and more high, which has become the bottleneck that restricts the performance of the whole system. Using the memory interface integrated in the Beiqiao chip to provide a data exchange path between CPU and memory is the main method to solve this problem. The research object of this paper is a X-high-performance memory interface in Beiqiao chip. Based on the basic learning of verification methodology, this paper introduces the basic architecture of X-Beiqiao chip, studies the related contents of memory interface, and builds a verification platform based on the full understanding of the timing and design of memory interface. The full function test points are extracted, and the ROM interface of its memory interface, the asynchronous DRAM interface and the checking function are verified. The verification results are analyzed. The verification results show that the functional verification method of the memory interface is feasible and has certain reference value for the design and verification of the high performance memory interface.
【学位授予单位】：西安电子科技大学
【学位级别】：硕士
【学位授予年份】：2012
【分类号】：TP333

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