面向新型阻变单元的脉冲测量系统设计
发布时间：2018-12-10 11:44
【摘要】：随着半导体制造工艺的进步与革新,以及消费电子产品对低功耗的要求进一步提高,Flash存储器无论是在存取速度和制作体积上,越来越不能满足当前的需求,新型阻变存储器应运而生。其结构简单、访问速度快的优势更加凸显。但存在编程／擦除不成功、耐受性差等可靠性问题,对测试设备的测试精度和速度提出了很高的要求。目前商用的测试模块主要存在两个问题：速度快精度差或速度慢精度高,均不能很好满足测试需求。并且这种商用的测试模块所配置的上位机软件也存在界面不够友好和不能深度定制驱动波形等缺点,大大降低了测试的效率。基于以上现状,本文以设计快速、灵活、可靠的阻变存储单元测试系统为目的,设计并实现阻变存储器测试系统,主要工作包括：1、通过需求分析,电路原理设计,软件仿真验证,原理图生成,PCB制作的过程完成系统硬件电路,使其具有可变驱动波形的发生和返回信号的高速高精度测量的功能,达到输出脉冲模式下脉冲宽度100ns-lms可调,幅度±5V可调；直流模式下-5V-5V的电压扫描。2、调试并优化模拟部分电路,完成电路电源系统、脉冲输出能力和电压电流检测能力测试,验证电路的稳定性与可靠性。测试结果显示波形发生速度可达50ns,驱动能力达100mA,并具有较高的检测精度。
[Abstract]:With the progress and innovation of semiconductor manufacturing technology and the further improvement of consumer electronic products' demand for low power consumption, Flash memory is increasingly unable to meet the current demand in terms of access speed and fabrication volume. A new type of resistive memory came into being. Its structure is simple, the advantage of fast access speed more prominent. However, there are some reliability problems, such as unsuccessful programming / erasure, poor tolerance and so on. Therefore, the test accuracy and speed of the test equipment are very high. At present, there are two main problems in commercial test modules: low speed and low precision, which can not meet the test requirements. Moreover, the software of this commercial test module also has some disadvantages, such as the interface is not friendly and the driving waveform can not be deeply customized, which greatly reduces the efficiency of the test. Based on the above situation, this paper aims to design a fast, flexible and reliable test system for the resistive memory unit. The main work includes: 1. Through the requirement analysis, the design of the circuit principle. The software simulation verifies, the schematic diagram is generated, the PCB process completes the system hardware circuit, makes it has the variable drive waveform generation and the return signal high speed high precision measurement function, achieves the output pulse mode pulse width 100ns-lms to be adjustable. The amplitude 卤5V is adjustable; Voltage scan of 5V-5V in DC mode. 2. Debug and optimize the analog circuit, complete the circuit power system, pulse output ability and voltage and current detection ability test, verify the stability and reliability of the circuit. The test results show that the waveform generation speed can reach 50 ns, the driving ability is up to 100 Ma, and the detection accuracy is high.
【学位授予单位】：山东大学
【学位级别】：硕士
【学位授予年份】：2016
【分类号】：TP333
本文编号：2370509
[Abstract]:With the progress and innovation of semiconductor manufacturing technology and the further improvement of consumer electronic products' demand for low power consumption, Flash memory is increasingly unable to meet the current demand in terms of access speed and fabrication volume. A new type of resistive memory came into being. Its structure is simple, the advantage of fast access speed more prominent. However, there are some reliability problems, such as unsuccessful programming / erasure, poor tolerance and so on. Therefore, the test accuracy and speed of the test equipment are very high. At present, there are two main problems in commercial test modules: low speed and low precision, which can not meet the test requirements. Moreover, the software of this commercial test module also has some disadvantages, such as the interface is not friendly and the driving waveform can not be deeply customized, which greatly reduces the efficiency of the test. Based on the above situation, this paper aims to design a fast, flexible and reliable test system for the resistive memory unit. The main work includes: 1. Through the requirement analysis, the design of the circuit principle. The software simulation verifies, the schematic diagram is generated, the PCB process completes the system hardware circuit, makes it has the variable drive waveform generation and the return signal high speed high precision measurement function, achieves the output pulse mode pulse width 100ns-lms to be adjustable. The amplitude 卤5V is adjustable; Voltage scan of 5V-5V in DC mode. 2. Debug and optimize the analog circuit, complete the circuit power system, pulse output ability and voltage and current detection ability test, verify the stability and reliability of the circuit. The test results show that the waveform generation speed can reach 50 ns, the driving ability is up to 100 Ma, and the detection accuracy is high.
【学位授予单位】：山东大学
【学位级别】：硕士
【学位授予年份】：2016
【分类号】：TP333
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