基于BOS-PSD0018的金属线胀系数测定

发布时间：2018-05-28 01:13

  本文选题：金属 + 线胀系数　； 参考：《大学物理》2017年01期

【摘要】：为提高金属线胀系数的测量精度和灵敏度,以方便数字化测量与微机处理,以PSD光电传感器为核心实现微位移测量,采用光学放大机构提高微位移分辨率,利用BOS-PSD0018芯片实现微位移转换,并用单片机系统实现金属线胀系数的数字化处理与显示.用铜棒进行了标定测试,用铁棒进行检测试验,检测试验表明金属线胀系数最大相对误差为±2.3%,用光学放大机构使微位移分辨率比提高4倍.
[Abstract]:In order to improve the measuring accuracy and sensitivity of metal linear expansion coefficient, the micro displacement measurement is realized with PSD photoelectric sensor as the core, and the resolution of micro displacement is improved by optical amplification mechanism. The BOS-PSD0018 chip is used to realize the micro-displacement conversion, and the single-chip microcomputer system is used to realize the digital processing and display of the metal linear expansion coefficient. The calibration test with copper rod and the test with iron bar show that the maximum relative error of linear expansion coefficient of metal is 卤2.3, and the resolution ratio of micro-displacement is increased 4 times by optical amplification mechanism.
【作者单位】： 湖南科技学院电子与信息工程学院;
【基金】：2013年湖南省科技厅科技计划项目(2013NK3026) 湖南科技学院“电路与系统”重点学科建设项目资助
【分类号】：O551.3-34
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本文编号：1944605